Atomic Force Microscopy Webinar Series
Beating the Diffraction Limit by 1000X
An introduction to nanoscale IR imaging on Bruker AFMs with applications in graphene
Thursday, June 27, 2013
8AM PDT/3PM GMT or 7PM PDT/2AM GMT
Join us as we introduce a particularly powerful capability recently implemented by researchers on Bruker AFMs.
Scattering Scanning Nearfield Optical Microscopy (sSNOM)
THE sSNOM FEATURES
» The XY imaging resolution surpassing 10nm! Beating the diffraction limit of conventional IR microscopes by as much as 1000X.
» Ultrahigh contrast imaging of graphene, the thinnest material known to man! With IR sSNOM one can clearly discern and reproducibly count graphene layers.
» Identification of materials at the nanoscale by their molecular resonances
OUR WEBINAR WILL COVER
» Introduction to the physics behind sSNOM
» Nanoscale identification of materials
» Applications results from graphene
Register Online
CLICK HERE for 8AM PDT / 3PM GMT session
CLICK HERE for 7PM PDT / 2AM GMT session
Don't miss it!
Your Bruker Webinar Team
All times given are Pacific Daylight Time and Greenwich Mean Time.
*Check your local times when registering.
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