Survey, Screening, Dynamics:
High-Speed AFM Imaging with
Bruker's Dimension FastScan^TM AFM

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Outline:

AFM has long been somewhat constrained to applications where its unique information and flexibility outweigh its limited imaging bandwidth. Academic efforts to increase the speed of AFM, while exciting, were generally focused tightly at time-resolving nanoscale processes, and were achieved in part by sacrificing versatility. To boost the productivity of AFM for a broad range of applications, each system component must support and contribute to higher imaging speeds while maintaining such high-performance characteristics as large scan range, excellent noise performance, flatness and force control.
Furthermore, only an easy, stable and high productivity work flow would be able to take advantage of the enhanced hardware performance.

We will discuss how the new Bruker FastScan^TM enables higher AFM productivity through higher bandwidth, and how this higher bandwidth can power discovery in Survey, Screening and Dynamics.

Dr Johannes Kindt Johannes Kindt received his undergraduate degree in Physics from the Technical University Kaiserslautern, Germany. For his Graduate work, he joined Paul Hansma's Lab at UC Santa Barbara on a Fulbright scholarship, and received his PhD for his new designs for High Speed AFM scanners, and his research on the ultrastructure and nanoscale failure behavior of bone and other biocomposites. He joined the Bruker AFM development team in 2005, and has led development efforts on a number of projects, including High Speed AFM technology, and AFM integration with high performance optical microscopy and with cell biological methods. His current focus is on the development of High Speed AFM applications, and the adoption of the AFM into new areas of research. Johannes is an author of over 25 peer-reviewed publications, and holds several patents. He currently lives near Mannheim, Germany.