Basic Principles of AFM Advanced Modes & Applications

We would like to invite you to attend a webinar dedicated to those students in the fields of physics, material science, polymers and all areas where Atomic Force Microscopy may be employed.  This webinar will also be useful as a refresher update for any Post Doc students or recent PhD graduates.

The webinar will cover the following topics:

•       Physical principles of Atomic Force Microscopy  –  contact and noncontact/semicontact modes, Phase, Amplitude (Feedback Error)
•       Choice of the cantilever
•       High resolution
•       Spreading resistance imaging (Conductive AFM/Current mapping)
•       Kelvin Probe Microscopy (KPM), single and double pass
•       Piezoresponse Force Microscopy (PFM)
•       Magnetic Force Microscopy (MFM)
•       Nanolithography mechanical and electrical, Vector and Raster
•       HybriD™ Mode, the future of the Atomic Force Microscopy.

This should help in terms of getting the results you require from your application of AFM within research parameters and help to crystallise some of the principles that are being taught within your institutions.

Please click the link below to register for this webinar.

Registration URL: https://attendee.gotowebinar.com/register/1765822630776009730
Webinar ID: 138-174-371

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