investigation and optimization.

In this application note, Kelvin force microscopy was used to measure the surface potential profile of a multijunction solar cell cross-section in relation to the intensity, wavelength, and beam position of a localized optical excitation (~400 nm spot diameter). The response, surface potential variation, of separate subcells was monitored. Experimental results are in good agreement with qualitative simulation.

The results were obtained using unique capabilities of NT-MDT atomic force microscope integrated with high resolution confocal optical techniques. They provide new insight into performance of solar cells on a nanometer scale level.

Please see the attached material for details: Solar_cell_AFM_optics.pdf