Atomic Force Microscopy Webinar Series

The Dimension FastScan AFM: SEM-like User Experience

True 3D Nanometrology and Quantitative Material Property Mapping in Ambient, Fluid, and Controlled Environments

Hosted by Microscopy and Analysis

Presenter
Dr. Johannes Kindt

Webinar Date & Time

Wednesday, December 7, 2011

Morning Broadcast, 8:00 AM PST*

Webinar Overview

This webinar will focus on the use of the Dimension FastScan atomic force microscope to obtain true 3D nanometrology and quantitative material property mapping in ambient, fluid, and controlled environments to give an SEM-like user experience.

Don't miss this unique opportunity to hear about the latest research using the world's fastest AFM.

The live broadcast will include a fully-interactive Q&A session to answer all of your applications questions. Register today to reserve your seat.

Register To Participate In Live Broadcast

Morning Broadcast, 8:00 AM PST*

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Your AFM Webinar Series Team