Atomic Force Microscopy Webinar Series - Atomic Imaging with Peak Force Tapping

Atomic Force Microscopy Webinar Series

Atomic Imaging with Peak Force Tapping


Webinar Presenter - Bede Pittenger, Ph.D.
Presenter Bede Pittenger, Ph.D., Senior Applications Scientist

Webinar Date & Time

Wednesday, June 13, 2012

Morning Broadcast, 8:00 AM PDT*

Webinar Overview

Peak Force Tapping is best known for its ability to provide high resolution, quantitative material property maps (using PeakForce QNM), or for its simple operation (with ScanAsyst). Over the last year, the high resolution capability has been demonstrated to the molecular level and beyond. Multiple systems were used to collect the data including our large-sample Dimension FastScan and Icon systems in addition to the MultiMode.

This webinar will review the latest atomic resolution results and how Peak Force Tapping enables new science at this level, including material recently featured on the cover of Microscopy & Analysis (European), May issue.

The live broadcast will include a fully-interactive Q&A session to answer all of your applications questions. Register today to reserve your seat.

Register To Participate In Live Broadcast

Morning Broadcast, 8:00 AM PDT*


Your AFM Webinar Series Team

*All times given are for PDT (Pacific Daylight Time, USA & Canada).
Check your local times when registering.

The Atomic Force Microscopy Webinar Series

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