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2012 European Conference on Electrical Measurements at the Nanoscale Using AFM

One-Day Conference: 4 July | Supplemental Demonstrations: 5 July | Location: Linz, Austria

 

Agilent Technologies cordially invites you to attend a scientific conference at Johannes Kepler University focusing on nanoscale electrical measurements enabled by atomic force microscopy (AFM) techniques. Diverse, recent work will be presented by leading experts from across Europe!

 

In addition to the conference on 4 July, there will be an optional day of hands-on demonstrations at JKU on 5 July. Enrollment for this day of supplemental activities is limited to 10 delegates (first-come, first-served basis). If you would like to attend the demos on 5 July, please let us know as soon as possible and provide a description of any samples you will be bringing.

 

Venue

Institute of Biophysics, Johannes Kepler University

Gruberstrasse 40, A-4020 Linz

Main Seminar Room, Basement

 

Chairs

Prof. Dr. Jürgen Smoliner (Vienna University of Technology)

 

Prof. Dr. Peter Hinterdorfer (Johannes Kepler University)

 

Agenda for 4 July

 

09:00     Registration

 

09:30    Welcome Address

Peter Hinterdorfer (JKU Linz)

 

09:40    Keynote Talk: Recent Developments in Characterization of Electrical Properties by Means of SPM

Jürgen Smoliner (TU Vienna)

 

10:15    Calibrated Capacitance & Dopant Density Profiling Using Scanning Microwave Microscopy

Ferry Kienberger (Agilent Labs, Linz)

 

10:45     Invited Talk; "Nanocrystallites in amorphous high-k Oxides Sensitized by Impedance Measurements

Heidemarie Schmidt (TU Chemnitz)

 

 

11:15      Break

 

11:45      Invited Talk: Characterization of Semiconductor Devices Using Scanning Microwave Microscopy

Jesper Wittborn (Infineon Technologies, Munich)

 

12:15     Studies of Electromechanical Properties of Atomic & Molecular Junctions by Conductive-Probe AFM

Ilya V. Pobelov (University of Bern)

 

12:40       Lunch & Small Poster Session

 

14:10       Invited Talk: Detection of Electric Charge Pattern & Selective Protein Absorption on Biomaterials

 Abbasi Gandhi (University of Limerick)

 

14:40       Invited Talk: 2 nm Quantum Optical Lithography

 Eugen Pavel (Storex Technologies, Bucharest)

 

15:10       Resiscope Introduction... High-Resolution Electrical Measurements Using AFMs

 Louis Pacheco (ScienTec, Paris)

 

15:30       Break

 

15:50       Tracking Photoelectronic Processes at Organic/Inorganic Interfaces by Raman-KFM

 Raul Rodriguez (TU Chemnitz)

 

16:15       Double-Layer Force Spectroscopy... Applications in Surface Charge Characterization of Tooth Enamel

 Gennady Lubarsky (University of Ulster)

 

16:40       Close & Organization of Hands-on Demonstrations for 5 July

 

19:00       Meeting Time for Conference Dinner

 

To register for this unique and dynamic event, please Register Here.

 

We look forward to seeing you in Linz this July!

 

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