2012 European Conference on Electrical Measurements at the Nanoscale Using AFM
One-Day Conference: 4 July | Supplemental Demonstrations: 5 July | Location: Linz, Austria
Agilent Technologies cordially invites you to attend a scientific conference at Johannes Kepler University focusing on nanoscale electrical measurements enabled by atomic force microscopy (AFM) techniques. Diverse, recent work will be presented by leading experts from across Europe!
In addition to the conference on 4 July, there will be an optional day of hands-on demonstrations at JKU on 5 July. Enrollment for this day of supplemental activities is limited to 10 delegates (first-come, first-served basis). If you would like to attend the demos on 5 July, please let us know as soon as possible and provide a description of any samples you will be bringing.
Venue
Institute of Biophysics, Johannes Kepler University
Gruberstrasse 40, A-4020 Linz
Main Seminar Room, Basement
Chairs
Prof. Dr. Jürgen Smoliner (Vienna University of Technology)
Prof. Dr. Peter Hinterdorfer (Johannes Kepler University)
Agenda for 4 July
09:00 Registration
09:30 Welcome Address
Peter Hinterdorfer (JKU Linz)
09:40 Keynote Talk: Recent Developments in Characterization of Electrical Properties by Means of SPM
Jürgen Smoliner (TU Vienna)
10:15 Calibrated Capacitance & Dopant Density Profiling Using Scanning Microwave Microscopy
Ferry Kienberger (Agilent Labs, Linz)
10:45 Invited Talk; "Nanocrystallites in amorphous high-k Oxides Sensitized by Impedance Measurements
Heidemarie Schmidt (TU Chemnitz)
11:15 Break
11:45 Invited Talk: Characterization of Semiconductor Devices Using Scanning Microwave Microscopy
Jesper Wittborn (Infineon Technologies, Munich)
12:15 Studies of Electromechanical Properties of Atomic & Molecular Junctions by Conductive-Probe AFM
Ilya V. Pobelov (University of Bern)
12:40 Lunch & Small Poster Session
14:10 Invited Talk: Detection of Electric Charge Pattern & Selective Protein Absorption on Biomaterials
Abbasi Gandhi (University of Limerick)
14:40 Invited Talk: 2 nm Quantum Optical Lithography
Eugen Pavel (Storex Technologies, Bucharest)
15:10 Resiscope Introduction... High-Resolution Electrical Measurements Using AFMs
Louis Pacheco (ScienTec, Paris)
15:30 Break
15:50 Tracking Photoelectronic Processes at Organic/Inorganic Interfaces by Raman-KFM
Raul Rodriguez (TU Chemnitz)
16:15 Double-Layer Force Spectroscopy... Applications in Surface Charge Characterization of Tooth Enamel
Gennady Lubarsky (University of Ulster)
16:40 Close & Organization of Hands-on Demonstrations for 5 July
19:00 Meeting Time for Conference Dinner
To register for this unique and dynamic event, please Register Here.
We look forward to seeing you in Linz this July!
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