AFM Webinar Series - Fundamentals of Scanning Probe Microscopy

Fundamentals of Scanning Probe Microscopy: Learn the fundamentals of SPM from the experts at Veeco, covering the theory and practice of this versatile technique that enables topographical as well as mechanical and electrical property measurement at the nanoscale. Dr. Stefan Kaemmer, Applications Manager at Veeco, will provide an overview of SPM and related techniques. The webinar will cover the following topics: Definitions of SPM Basic AFM Components Contact Mode AFM TappingMode AFM PiezoElectric Scanners Probes AFM Platforms for different applications For your convenience, we will have two webinars on Wednesday, September 23, 2009. Register Here For Morning Broadcast - 8:30 AM PDT (11:30 AM EDT) http://echo3.bluehornet.com/ct/3390595:4790475251:m:3:117417985:6D1B52A0C8C88AE3CE31683F420F7AE6 Register Here For Evening Broadcast - 5:30 PM PDT (8:30 PM EDT) http://echo3.bluehornet.com/ct/3390596:4790475251:m:3:117417985:6D1B52A0C8C88AE3CE31683F420F7AE6 The Veeco Atomic Force Microscopy Webinar Series at www.veeco.com/afm-webinars Missed a webinar? See our archives at www.veeco.com/afm-webinar-archives
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