AFM Webinar Series - Fundamentals of Scanning Probe Microscopy

Fundamentals of Scanning Probe Microscopy: Learn the fundamentals of SPM from the experts at Veeco, covering the theory and practice of this versatile technique that enables topographical as well as mechanical and electrical property measurement at the nanoscale. Dr. Stefan Kaemmer, Applications Manager at Veeco, will provide an overview of SPM and related techniques. The webinar will cover the following topics: Definitions of SPM Basic AFM Components Contact Mode AFM TappingMode AFM PiezoElectric Scanners Probes AFM Platforms for different applications For your convenience, we will have two webinars on Wednesday, September 23, 2009. Register Here For Morning Broadcast - 8:30 AM PDT (11:30 AM EDT) Register Here For Evening Broadcast - 5:30 PM PDT (8:30 PM EDT) The Veeco Atomic Force Microscopy Webinar Series at Missed a webinar? See our archives at
Votes: 0
E-mail me when people leave their comments –

You need to be a member of The International NanoScience Community - to add comments!

Join The International NanoScience Community -