SEM like user experience, True 3D nanometrology
and quantitative material property mapping in ambient, fluid, and controlled environments

is being held on
Wednesday, 07 December 2011
at 4pm (UK), 5pm (CET) and 11am (EDT)

Click here to register >>>

Outline:

In many applications Atomic Force Microscopy (AFM) can provide unique and preferred sample information, however its slow speed and high complexity have often offset these benefits in favor of Electron Microscopy.

The latest generation of Bruker’s AFM, the Dimension FastScan^TM, enables nanometer resolution imaging, in a fraction of a minute, on a large-sample, fully automatable stage. The included ScanAsyst^TM algorithm provides robust, intuitive, self-optimizing work-flow based operation. Combined these two capabilities create a highly productive nano-imaging solution akin to current Scanning Electron Microscopes (SEM).

While both techniques provide surface imaging on the nano scale, the insights gained from each technique are also complimentary:

• AFM can be performed, at nm-resolution, in ambient and fluid environments, and typically requires no alterations of the sample surface chemistry prior to imaging. This enables non-destructive sample prep, convenient (multi-) sample loading, easy sample access, and imaging of dynamic sample changes over time.

• AFM provides true nano-metrological information in all three sample dimensions

• While SEM techniques can provide contrast based on elemental analysis, the latest-generation AFM mode, Bruker’s proprietary PeakForce-QNM, provides quantitative nanoscale mapping of surface mechanical properties, such as modulus, adhesion, or dissipation, in addition to the standard topographical information

Please join us for this focused review of the recent advances of the “other” nanoscale surface imaging technology

Speaker:

Dr Johannes Kindt Johannes Kindt received his undergraduate degree in Physics from the Technical University Kaiserslautern, Germany. For his Graduate work, he joined Paul Hansma's Lab at UC Santa Barbara on a Fulbright scholarship, and received his PhD for his new designs for High Speed AFM scanners, and his research on the ultrastructure and nanoscale failure behavior of bone and other biocomposites. He joined the Bruker AFM development team in 2005, and has led development efforts on a number of projects, including High Speed AFM technology, and AFM integration with high performance optical microscopy and with cell biological methods. His current focus is on the development of High Speed AFM applications, and the adoption of the AFM into new areas of research. Johannes is an author of over 25 peer-reviewed publications, and holds several patents. He currently lives near Mannheim, Germany.