Photos 2.0

X-ray microanalyser CAMECA SEMPROBE SU-30 equipped with 2 WDS and EDS (NORAN Voyager 3100). The instrument makes possible to detect all elements start from Be in microareas. Advanced softwares for quantitative analysis of bulk samples, thin layers and small particles as well as for image analysis are in use. ECP in microaraeas is possible Machine available in the Faculty of Materials Science and Engineering at the Warsaw University of Technology offers a professional chemical composition analysis. Attachments of the machine and experience of the workers allows characterization of the materials chemical composition at the sophisticated level including a very high precision of the quantitative data. Due to the specific solutions of the MPA imaging of the microstructure with the secondary (SE) as well as back scatter electrons (BSE) is possible. Details of the materials chemical composition characterization offered by MPA: - Wavelength dispersive spectrometry (WDS) - Energy dispersive spectrometry (EDS) - Quantitative and qualitative chemical composition analysis in a micron-size areas - Analysis of a linear distribution of chemical compounds - Thin layers (>1,5nm) quantitative chemical composition analysis - Small particles (>1mm) quantitative chemical composition analysis