'Seeing at the Nanoscale VI', is the 6th in a series of annual scientific conferences focusing on nanostructural imaging, characterization, and modification using scanning probe microscopy (SPM) and related techniques.The conference location is in the center of Berlin, Germany, July 9-11, 2008. Sponsored by Veeco Instruments and supported by Humboldt University Berlin, Department of Physics, this event includes technical presentations, a nanotechnology poster contest, and a gala dinner to get special flaviour from Berlin.Highlighted by the conference chairman Prof. Dr. Jürgen P. Rabe Seeing at the Nanoscale VI provides an optimum forum for "scientists to speak to scientists" on a wide variety of nanotechnology topics with four technical sessions on:Session I: Extending the limits of SPM: high speed scanning, ultra high resolution imaging, multiple probe SPM, novel probesChair: Georg Schitter, TU Delft, Delft, The NetherlandsKeynote: Toshio Ando, Kanazawa University, Kanazawa, JapanInvited: Oscar Custance, National Institute for Material Science (NIMS), Tsukuba, JapanSession II: From single biomolecules to cells: using AFM and combined AFM-opticalChair: Hans Oberleithner, Universitat Muenster, Muenster, GermanyKeynote: Daniel Mueller, BIOTEC, Dresden, GermanyInvited: Clive Roberts, Chair of Pharmaceutical Nanotechnology, School of Pharmacy and Director of the Nottingham Nanotechnology and Nanoscience Centre The University of Nottingham, United KingdomSession III: Next generation materials and polymer systemsChair: G.J. Vancso, Universiteit Twente, Enschede, The NetherlandsKeynote: Jiro Kumaki Yashima, Super-structured Helix Project, ERATO, JST, Nagoya, JapanInvited: Christian Fretigny CNRS, Paris, FranceSession IV: Beyond topography: measurement of physical properties at the Nanoscale - nanomechanical, electrical, optical, magnetic and thermalChair: Robert W. Stark, Ludwig-Maximilians-Universitat Muenchen, Munich, GermanyKeynote: Wilfried Vandervorst, IMEC, Leuven, Belgium and Dept. Physics, KULeuven, BelgiumInvited: Ozgur Sahin Harvard University, USA
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