AFM Webinar Series - Fundamentals of Scanning Probe Microscopy

Fundamentals of Scanning Probe Microscopy:

Learn the fundamentals of SPM from the experts at Veeco, covering the theory and practice of this versatile technique that enables topographical as well as mechanical and electrical property measurement at the nanoscale.

Dr. Stefan Kaemmer, Applications Manager at Veeco, will provide an overview of SPM and related techniques. The webinar will cover the following topics:

Definitions of SPM
Basic AFM Components
Contact Mode AFM
TappingMode AFM
PiezoElectric Scanners
AFM Platforms for different applications

For your convenience, we will have two webinars on Wednesday, September 23, 2009.

Register Here For Morning Broadcast - 8:30 AM PDT (11:30 AM EDT)

Register Here For Evening Broadcast - 5:30 PM PDT (8:30 PM EDT)

The Veeco Atomic Force Microscopy Webinar Series at

Missed a webinar? See our archives at

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Tags: afm-webinars, veeco


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Publications by A. Paszternák:

Smartphone-Based Extension of the Curcumin/Cellophane pH Sensing Method

Pd/Ni Synergestic Activity for Hydrogen Oxidation Reaction in Alkaline Conditions

The potential use of cellophane test strips for the quick determination of food colours

pH and CO2 Sensing by Curcumin-Coloured Cellophane Test Strip

Polymeric Honeycombs Decorated by Nickel Nanoparticles

Directed Deposition of Nickel Nanoparticles Using Self-Assembled Organic Template,

Organometallic deposition of ultrasmooth nanoscale Ni film,

Zigzag-shaped nickel nanowires via organometallic template-free route

Surface analytical characterization of passive iron surface modified by alkyl-phosphonic acid layers

Atomic Force Microscopy Studies of Alkyl-Phosphonate SAMs on Mica

Amorphous iron formation due to low energy heavy ion implantation in evaporated 57Fe thin films

Surface modification of passive iron by alkylphosphonic acid layers

Formation and structure of alkylphosphonic acid layers on passive iron

Structure of the nonionic surfactant triethoxy monooctylether C8E3 adsorbed at the free water surface, as seen from surface tension measurements and Monte Carlo simulations

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