AFM Webinar Series - Fundamentals of Scanning Probe Microscopy

Fundamentals of Scanning Probe Microscopy:

Learn the fundamentals of SPM from the experts at Veeco, covering the theory and practice of this versatile technique that enables topographical as well as mechanical and electrical property measurement at the nanoscale.

Dr. Stefan Kaemmer, Applications Manager at Veeco, will provide an overview of SPM and related techniques. The webinar will cover the following topics:

Definitions of SPM
Basic AFM Components
Contact Mode AFM
TappingMode AFM
PiezoElectric Scanners
AFM Platforms for different applications

For your convenience, we will have two webinars on Wednesday, September 23, 2009.

Register Here For Morning Broadcast - 8:30 AM PDT (11:30 AM EDT)

Register Here For Evening Broadcast - 5:30 PM PDT (8:30 PM EDT)

The Veeco Atomic Force Microscopy Webinar Series at

Missed a webinar? See our archives at

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