Tour of the Hiden SIMS Workstation, a UHV Surface Analysis System for Thin Film Depth Profiling

Views: 36
Get Embed Code
The Hiden SIMS Workstation is a stand-alone, general purpose, UHV SIMS/SNMS analysis system based around the MAXIM analyser. The instrument is both powerful and easy to use with a self-tuning secondary ion column and software controlled ion guns.- Rapid turnaround of all types of samples- Static and dynamic SIMS- Integral ioniser for SNMS and RGA- Choice of Ion guns- SNMS surface mapping / imaging- Surface contamination analysis- Quantification of matrix level by SNMS- Flexible and upgradeable configuration- Low cost of ownershipThe Hiden SIMS Workstation, an integrated UHV / SIMS facility for advanced surface analysis, featuring:- Hiden MAXIM SIMS analyser operating under MASsoft for ppb analysis.- Intergrated ioniser for efficient SNMS analysis.- Choice of differentially pumped Hiden IG20 Gas, IG-5C Caesium, IFG200 FAB or high performance liquid gallium guns as primary excitation source.- Integral ion gun raster control with signal gating for depth profiling.- Electron flood gun option for charge neutralisation in insulator studies.- Vacuum chamber bakeout heaters.- Fast sample transfer, sample holder and manipulator with load lock.- UHV manipulator for optimum sample positioning.- SIMS elemental imaging option with ESM LabVIEW SIMS Imaging program.- Static SIMS Spectral Library available.- Automatic SIMS ion optics lens tuning, and automatic mass alignment for optimum SIMS performance.For further information on this or other Hiden products please contact Hiden Analytical at info@hiden.co.uk or visit the main website at http://www.HidenAnalytical.com.

You need to be a member of The International NanoScience Community - Nanopaprika.eu to add comments!

Join The International NanoScience Community - Nanopaprika.eu

E-mail me when people leave their comments –