Photos 2.0

rga (4)

XBS Triple Filter Mass Spectrometer configured for k-cell and e-gun MBE Deposition Rate Monitoring

by Hiden Analytical
Secondary ion mass spectrometer for UHV surface analysis and SNMS. The Hiden MAXIM

by Hiden Analytical
Vacuum Process Gas Analyser - HPR-30

by Hiden Analytical
EPIC Quadrupole mass spectrometers for UHV analysis of neutrals, radicals and ions

by Hiden Analytical

#xg { position:relative;top:120px; } #xn_bar { top:120px; }

Hello, you need to enable JavaScript to use The International NanoScience Community - Nanopaprika.eu.

Please check your browser settings or contact your system administrator.