Gender

Male


Location

Vladimir


Birthday:

September 21


I am...

Engineer, Doctor


My research field or area of interest innanotechnology

Nanoelectronics, ASIC, MEMS and NEMS design


Interest in...

Design for testability


Publication list

Mosin S. Neural Network-Based Technique for Detecting Catastrophic and Parametric Faults in Analog Circuits. Proc. of IEEE 18th International Conference on System Engineering (ICSEng’2005). – Las Vegas, Nevada, USA, 2005. – P. 224 – 229. Mosin S. G. Economics Modeling the DFT of Mixed-Signal Circuits. Proc. of IEEE East-West Design and Test Workshop (EWDTW’2006). – Sochi, Russia, 2006. – P. 236 – 238. – ISBN 966-659-124-3. Mosin S. G. The Features of Integrated Technologies Development in Area of ASIC Design // Proc. of 9th Conference the Experience of Designing and Application of CAD System in Microelectronics – CADSM’07, Lviv – Polyana, Ukraine, 2007. – P. 292 – 295. – ISBN 966-533-587-0. Kislyakov M., Mosin S. A Processor development in Programmable Logic Basis // Proc. of 9th Conference the Experience of Designing and Application of CAD System in Microelectronics – CADSM’07, Lviv – Polyana, Ukraine, 2007. – P. 182 – 185. – ISBN 966-533-587-0. Mosin S., Parnevich P. Strategy of selecting power reduction technique for energy-efficient semiconductor designs // Proceedings of the 4th Spring/Summer Young Researchers’ Colloquium on Software Engineering (SYRCoSE 2010), June 1-2, 2010 – Nizhny Novgorod, Russia, p. 123 – 124. – ISBN 978-5-91474-015-0. Mosin S., Chebykina N. A Technique of Optimal Built-In Self-Test Circuitries Generation // Proc. of IEEE East-West Design and Test Symposium (EWDTS’2010). – St.-Peterburg, Russia, 2010. – P. 145 – 148. – ISBN 978-1-4244-9555-9. Mosin S. Structural solution of reconfiguration based built-in self-test for analog and mixed-signal IC // In Proc. of 12th Biennial Baltic Electronics Conference (BEC’2010). Tallinn, October, 2010, pp. 141 – 144. – ISBN 978-1-4244-7357-1. Mosin S.G. A Built-in Self-Test Circuitry Based on Reconfiguration for Analog and Mixed-Signal IC // Information Technology and Control. – 2011. Vol. 40. No. 3. – P. 260 – 264. – ISSN 1392 – 124X. Mosin S., Chebykina N. A, Serina M.S. A Subsystem for Automated Synthesis of LFSR-Based Test Generator for Deterministic and Pseudorandom Testing // Proc. of IEEE East-West Design and Test Symposium (EWDTS’2011). – Sevastopol, Ukraine, 2011. – P. 177 – 179.


Researchgroup, Institute, University, School, Company name

Vladimir State University


Researchgroup, Institute, Company, University, School webpage

http://www.vlsu.ru


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