Gender
Male
Location
Moscow
Birthday:
June 30
Age:
56
I am...
Physicist, Engineer, User of nanotechnology products
My research field or area of interest innanotechnology
scanning tunneling microscopy (STM), atomic-force microscopy (AFM), scanning probe microscopy (SPM), optical profilometry (OP), infrared microscopy (IRM), high capacity probe storage, nanometrology, automatic surface characterization, nanolithography, nanomanipulation, nanoassembling, bottom-up nanofabrication, molecular manufacturing, nanotechnology, catalytic nanoparticles, micromechanical bimaterial infrared detectors
Interest in...
I am searching for partner(s) interested in further development and/or commercialization of the feature-oriented scanning (FOS) methodology that is applicable for high-precision, high-resolution scanning probe microscopy, automatic surface characterization, nanometrology, and unmanned bottom-up nanofabrication both in single- and multiprobe configurations. Feel free to contact me if you have any questions, comments or research/business proposals related to such collaboration.
Publication list
R. V. Lapshin, “Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode”, Applied Surface Science, volume 470, pages 1122-1129, 2019 R. V. Lapshin, “Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode”, Applied Surface Science, volume 378, pages 530-539, 2016 R. V. Lapshin, “STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite”, Applied Surface Science, volume 360, part B, pages 451-460, 2016 R. V. Lapshin, “Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description”, Applied Surface Science, volume 359, pages 629-636, 2015 R. V. Lapshin, R. Z. Khafizov, E. A. Fetisov, “Mathematical treatment of the output optical image of a focal plane array of uncooled bimaterial detectors of infrared range by method of feature-oriented scanning”, Instruments and Experiment Technique, number 5, pages 52-58, 2015 (in Russian); R. V. Lapshin, R. Z. Khafizov, E. A. Fetisov, “Computer processing of the output optical image of a focal plane array of uncooled bimaterial IR-detectors by method of feature-oriented scanning”, Instruments and Experimental Techniques, volume 58, number 5, pages 631-636, 2015 R. Lapshin, “Feature-oriented scanning probe microscopy: precision measurements, nanometrology, bottom-up nanotechnologies”, Electronics: Science, Technology, Business, Special issue “50 years of the Institute of Physical Problems”, number 9, pages 94-106, 2014 (in Russian) R. Lapshin, P. Azanov, “Nickel nanoparticles reduce temperature of synthesis of carbon nanostructures”, Electronics: Science, Technology, Business, Special issue “50 years of the Institute of Physical Problems”, number 9, pages 112-115, 2014 (in Russian) D. B. Rygalin, E. A. Fetisov, R. Z. Khafizov, V. I. Zolotarev, I. A. Reshetnikov, G. A. Rudakov, R. V. Lapshin, E. P. Kirilenko, “Promising integral matrix detectors of thermal radiation with optical reading”, Russian Microelectronics, volume 43, number 7, pages 516-518, 2014 R. Z. Khafizov, E. A. Fetisov, R. V. Lapshin, E. P. Kirilenko, V. N. Anastasyevskaya, I. V. Kolpakov, “Thermomechanical sensitivity of uncooled bimaterial detector of IR-range fabricated by technology of microoptomechanical systems”, Advances in Applied Physics, volume 1, number 4, pages 520-523, 2013 (in Russian) R. V. Lapshin, “Feature-oriented scanning probe microscopy”, Encyclopedia of Nanoscience and Nanotechnology, edited by H. S. Nalwa, volume 14, pages 105-115, American Scientific Publishers, 2011 A. P. Alekhin, G. M. Boleiko, S. A. Gudkova, A. M. Markeev, A. A. Sigarev, V. F. Toknova, A. G. Kirilenko, R. V. Lapshin, E. N. Kozlov, D. V. Tetyukhin, “Synthesis of biocompatible surfaces by nanotechnology methods”, Russian nanotechnologies, volume 5, numbers 9-10, pages 128-136, 2010 (in Russian); A. P. Alekhin, G. M. Boleiko, S. A. Gudkova, A. M. Markeev, A. A. Sigarev, V. F. Toknova, A. G. Kirilenko, R. V. Lapshin, E. N. Kozlov, D. V. Tetyukhin, “Synthesis of biocompatible surfaces by nanotechnology methods”, Nanotechnologies in Russia, volume 5, numbers 9-10, pages 696-708, 2010 R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, “Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 1, pages 5-16, 2010 (in Russian); R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, “Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface”, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, volume 4, number 1, pages 1-11, 2010 R. V. Lapshin, “Availability of feature-oriented scanning probe microscopy for remote-controlled measurements on board a space laboratory or planet exploration rover”, Astrobiology, volume 9, number 5, pages 437-442, 2009 R. V. Lapshin, “Method for automatic correction of drift-distorted SPM-images”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 11, pages 13-20, 2007 (in Russian); R. V. Lapshin, “A method for automatic correction of drift-distorted SPM images”, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, volume 1, number 6, pages 630-636, 2007 R. V. Lapshin, “Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition”, Measurement Science and Technology, volume 18, issue 3, pages 907-927, 2007 (Russian translation is available) A. P. Alekhin, A. G. Kirilenko, A. I. Kozlitin, R. V. Lapshin, S. N. Mazurenko, “Hydrophobic-hydrophilic nanostructure synthesis on polymer surfaces in low-temperature carbon plasma”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 11, pages 8-11, 2006 (in Russian) R. V. Lapshin, “Automatic distributed calibration of probe microscope scanner”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 11, pages 69-73, 2006 (in Russian) R. V. Lapshin, “Feature-oriented scanning methodology for probe microscopy and nanotechnology”, Nanotechnology, volume 15, issue 9, pages 1135-1151, 2004 (Russian translation is available) A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, “Surface morphology of thin carbon films deposited from plasma on polyethylene with low density”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 2, pages 3-9, 2004 (in Russian) A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev, “Investigation of nanostructured carbon coating on polyethylene as a substrate”, Journal of Applied Chemistry, volume 76, number 9, pages 1536-1540, 2003 (in Russian); A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev, “Nanostructured carbon coatings on polyethylene films”, Russian Journal of Applied Chemistry, volume 76, number 9, pages 1497-1501, 2003 R. V. Lapshin, “Digital data readback for a probe storage device”, Review of Scientific Instruments, volume 71, number 12, pages 4607-4610, 2000 R. V. Lapshin, “Automatic lateral calibration of tunneling microscope scanners”, Review of Scientific Instruments, volume 69, number 9, pages 3268-3276, 1998 R. V. Lapshin, “Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope”, Review of Scientific Instruments, volume 66, number 9, pages 4718-4730, 1995 (Russian translation is available, supplementary materials: Mathcad worksheet “Hysteresis loop”) R. V. Lapshin, “Hysteresis compensation model for STM scanning unit”, Proceedings of the Second International Conference on Nanometer-Scale Science and Technology (NANO-II), Herald of Russian Academy of Technological Sciences, volume 1, number 7, part B, pages 511-529, Moscow, Russia, 1994 (supplementary materials: Mathcad worksheet “Hysteresis loop”) R. V. Lapshin, O. V. Obyedkov, “Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes”, Review of Scientific Instruments, volume 64, number 10, pages 2883-2887, 1993
Researchgroup, Institute, University, School, Company name
Solid Nanotechnology Laboratory, Nanoelectronics Department, Institute of Physical Problems named after F. V. Lukin
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Comments
andras paszternak, editor