Webinar next week - Advances in AFM Nanomechanics - Wed, Feb. 20th

Atomic Force Microscopy Webinar Series - Nanomechanical AFM Measurements on Biological Samples

Atomic Force Microscopy Webinar Series

Advances in AFM Nanomechanics

Webinar Date & Time

» Wednesday, February 20, 2013 8:00 AM PST*



Dr. Bede Pittenger, Senior Applications Scientist, Bruker Nano Surfaces

Graphene dataset

Correlated PeakForce QNM and PeakForce KPFM images of the same graphene flake, prepared on silicon dioxide (Dimension Icon AFM, 15um scan). The topographic and electrical maps both show the expected layered structure. The top left topographic image reveals the expected 300pm graphene step between successive layers. The images to show detailed mechanical property measurements of a defect rich area to reveal fine structures with greater compliance (darker areas on the modulus map image) and reduced adhesion compared to the undisturbed portion of the layer.

Webinar Overview

Atomic force microscopes (AFM) can measure and map mechanical properties of materials with very high resolution. Recently, real-time control of the peak force of the tip-sample interaction has led to a fundamental change in AFM imaging, providing quantitative mapping of mechanical properties at unprecedented resolution. During material property mapping, the time scale of tip-sample interaction now spans from microseconds to seconds, tip sample forces can be controlled from piconewtons to micronewtons, and spatial resolution can reach sub-nanometer. AFM has become a unique mechanical measurement tool having large dynamic range (1kPa to 100GPa in modulus) with the flexibility to integrate with other physical property characterization techniques.

In this webinar we will describe the high resolution mechanical property mapping capabilities of PeakForce QNM and Force Volume as well as demonstrating the ability to examine the details of the tip-sample interaction in individual curves. Additionally, we will discuss the benefits of doing co-located measurements with other techniques such as Kelvin Probe Force Microscopy (KPFM) and Raman for research into samples as diverse as bacteria and graphene.

The live broadcast will include a fully-interactive Q&A session to answer all of your applications questions. Register today to reserve your seat.


January 23, 2013, 8:00 AM PST*

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Publications by A. Paszternák:

Smartphone-Based Extension of the Curcumin/Cellophane pH Sensing Method

Pd/Ni Synergestic Activity for Hydrogen Oxidation Reaction in Alkaline Conditions

The potential use of cellophane test strips for the quick determination of food colours

pH and CO2 Sensing by Curcumin-Coloured Cellophane Test Strip

Polymeric Honeycombs Decorated by Nickel Nanoparticles

Directed Deposition of Nickel Nanoparticles Using Self-Assembled Organic Template,

Organometallic deposition of ultrasmooth nanoscale Ni film,

Zigzag-shaped nickel nanowires via organometallic template-free route

Surface analytical characterization of passive iron surface modified by alkyl-phosphonic acid layers

Atomic Force Microscopy Studies of Alkyl-Phosphonate SAMs on Mica

Amorphous iron formation due to low energy heavy ion implantation in evaporated 57Fe thin films

Surface modification of passive iron by alkylphosphonic acid layers

Formation and structure of alkylphosphonic acid layers on passive iron

Structure of the nonionic surfactant triethoxy monooctylether C8E3 adsorbed at the free water surface, as seen from surface tension measurements and Monte Carlo simulations

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