Totally integrated SEM/FIB/AFM system

Dear Nanocommunity members,

we would like to inform the community that Danish Micro Engeneering (DME) has developed a new totally integrated SEM/SPM System. The system is based on a Zeiss AURIGA (R) Crossbeam Workstation and the newly developed DME UHV/AFM. The complete hardware and software integration of both systems result in the new Binnig-Rohrer-Ruska microscope (BRR) which opens totally new possibilities in the nano characterization of surfaces of all kinds.

The first model of the BRR is now installed and can be presented to interested members of the community in demo session. To inform yourself please use our website ( and the link below showing the instrument in live measurement.

Best regards,

Dr. Nils Anspach

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Tags: AFM


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