The AFM Probe - Fundamentals, Selection, and Applications

Atomic Force Microscopy Webinar Series - The AFM Probe

Atomic Force Microscopy Webinar Series

The AFM Probe - Fundamentals, Selection, and Applications

Ever wondered which probe to use for your research? Register for our webinar and learn from the experts!

Tuesday, October 29, 2013
8AM PT/3PM GMT or 7PM PT/2AM GMT

INTRODUCTION

When performing an AFM measurement one of the most important decisions made is the selection of the proper probe. This decision can make the difference between groundbreaking results or hours of lost time-to-data. When making a probe selection, one is faced with a cornucopia of options and this decision may feel daunting.

THIS WEBINAR WILL:

» Begin with the role of the probe in an AFM measurement; covering the fundamentals of an AFM probe such as cantilever stiffness and frequency, probe shape and probe material and coatings

» Provide an in-depth, application specific presentation of probes for common experiments. Topics covered include probes for high resolution and high speed imaging; biological AFM, electrical AFM, nanomechanical AFM and Tip Enhanced Raman (TERS).

» Review several methods for probe cleaning

» Close with a review of available application notes, materials, and resources related to AFM probe selection

Register Online

CLICK HERE for 8AM PDT / 3PM GMT session

CLICK HERE for 7PM PDT / 2AM GMT session

Don't miss it!

Your Bruker Webinar Team

All times given are Pacific Time and Greenwich Mean Time.
*Check your local times when registering.

Watch Past AFM Webinars Videos

Bruker Nano Surfaces AFM Webinars

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