SPIP™ is an advanced software package that provides researchers with a comprehensive toolkit for working with microscope data such as images, profiles, IV- and force curve data, including:

• Correction tools for creating the most accurate presentation of the "true" surface

• Automated analysis techniques assuring high accuracy, quality and efficiency

• Visualization and reporting tools enabling convincing and impressive communication of results

Strongly rooted in metrology, SPIP™ is known for its resulting accuracy and detail, when processing and analyzing microscope data. Comprehensive visualization tools allow adjustment and personalization of image presentations, and the customizable tools ensure efficiency and productivity for the user.

SPIP™ supports file formats from many microscope types including scanning probe microscopes (SPM, AFM, STM, SNOM, etc.), electron microscopes (SEM, TEM), interference microscopes, confocal microscopes, optical microscopes, and profilers along with their more than 100 file formats.

SPIP™ can be configured to individual user needs by selecting an appropriate package and can be handled with ease by both skilled researchers and beginners. Customers receive fast and qualified individual help form the SPIP™ support team.

Find out more by visiting our website or download a free evaluation license to try out SPIP™ yourself: