Russian scientists are studying light sources

For many experiments, it is important to know the exact wavelength of the source of light. Unfortunately, wavelengths of lasers or light-emitting diodes are subject to change depending on the environment factors such as ambient temperature. Those changes that can be as significant as a fraction of a nanometer are important for exploring the structural positions of ions in metals. Today, equipment is calibrated using emission spectrum analysis (spectrophotometric method) but this is a difficult process, however, requiring long-term stable temperature of the light source.

Scientists at the Institute of Semiconductor Physics, Siberian Branch of the Russ... have suggested a principally new and simpler method of measuring emission wavelength which allows to detect changes of up to 10−3 nanometer.

The article was published in the Nauchnoye Priborostroyeniye magazine (the Scientific Instrument Engineering).

Ellipsometer is an optical device commonly used to identify the properties of a substance. During a regular procedure, polarised light with a known wavelength is emitted through the sample in order to determine its properties based on the nature of the phase shift. The Novosibirsk-based researchers suggested using the ellipsometer to address an opposite task: to let a ray of light through a substance with known properties in order to calculate the light wavelength using the phase shift.

Preliminary calibration of the device allows to determine the phase shift for any light wavelength. When the measurements are done, the researchers can calculate the light source wavelength knowing the phase shift. In the course of the experiment, the emission of one and the same laser was studied at 22 C° and 32 C°. It was discovered that in the former example it generates light with the wavelength of 660.0 nanometer, and in the latter case the wavelength is 660.6 nanometer. Such minute change can insignificantly distort the results of some physical experiments. The researchers believe that the method will meet a high demand as convenient and miniature ellipsometer already exist.

Further information: D. V. Marin, V. N. Fedorinin, Tokhir Khasanov, “Measuring the Wavelength of Light Sources Using Ellipsometer Method.” the Scientific Instrument Engineering, vol. 21, March 2011.

Dmitrij Tsendin published by

Views: 15

Tags: light, nano, scientist, source, studying


You need to be a member of The International NanoScience Community to add comments!

Join The International NanoScience Community

Next partner events of TINC

We are Media Partner of:

Welcome - about us

Welcome! Nanopaprika was cooked up by Hungarian chemistry PhD student in 2007. The main idea was to create something more personal than the other nano networks already on the Internet. Community is open to everyone from post-doctorial researchers and professors to students everywhere.

There is only one important assumption: you have to be interested in nano!

Nanopaprika is always looking for new partners, if you have any idea, contact me at

Dr. András Paszternák, founder of Nanopaprika

Publications by A. Paszternák:

Pd/Ni Synergestic Activity for Hydrogen Oxidation Reaction in Alkaline Conditions

The potential use of cellophane test strips for the quick determination of food colours

pH and CO2 Sensing by Curcumin-Coloured Cellophane Test Strip

Polymeric Honeycombs Decorated by Nickel Nanoparticles

Directed Deposition of Nickel Nanoparticles Using Self-Assembled Organic Template,

Organometallic deposition of ultrasmooth nanoscale Ni film,

Zigzag-shaped nickel nanowires via organometallic template-free route

Surface analytical characterization of passive iron surface modified by alkyl-phosphonic acid layers

Atomic Force Microscopy Studies of Alkyl-Phosphonate SAMs on Mica

Amorphous iron formation due to low energy heavy ion implantation in evaporated 57Fe thin films

Surface modification of passive iron by alkylphosphonic acid layers

Formation and structure of alkylphosphonic acid layers on passive iron

Structure of the nonionic surfactant triethoxy monooctylether C8E3 adsorbed at the free water surface, as seen from surface tension measurements and Monte Carlo simulations

Warning: require_once(xn-app://widgetlaboratory/apps/windex.php): failed to open stream: "XN_AppFilesystemStream::stream_open" call failed in /apps/nanoscience/index.php on line 5 Fatal error: require_once(): Failed opening required 'xn-app://widgetlaboratory/apps/windex.php' (include_path='.:/php/includes/XN:/php/includes/PEAR:/php/includes/other') in /apps/nanoscience/index.php on line 5