Open post doc position (1 years) in the field of three dimensionnal analysis of dislocations using (S)TEM techniques

The main topics will deal with:

Development of STEM based technique for the three dimensional analysis of dislocations and other kind of linear and punctual defects in materials.

A good background in materials sciences, disocation analysis and Weak-Beam dark field imaging is mandatory.

Experience in operating a Cs corrected, TEM as well as in programming and scripting for data analysis are of great advantage.

URL

Applications:

Email: cecile.hebert@epfl.ch

 

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