One-Day Scientific Conference on Electrical AFM Measurements in Linz

2012 European Conference on Electrical Measurements at the Nanoscale Using AFM

One-Day Conference: 4 July | Supplemental Demonstrations: 5 July | Location: Linz, Austria

 

Agilent Technologies cordially invites you to attend a scientific conference focusing on nanoscale electrical measurements enabled by atomic force microscopy (AFM) techniques, including scanning microwave microscopy (SMM) and single-pass Kelvin probe microscopy (KPM). Diverse, recent work will be presented by leading experts from across Europe.

 

This special event will be held on 4 July, 2012, at the Institute of Biophysics, Johannes Kepler University in Linz, Austria. The conference offers a fantastic opportunity to share your experiences, applications, and ideas with fellow researchers as well as Agilent staff scientists in a pleasant and professional environment!

 

In addition to the one-day conference on 4 July, there will be an optional day of hands-on demonstrations at JKU on 5 July. Enrollment for this day of supplemental activities is limited to 10 delegates (first-come, first-served basis). If you would like to attend the demos on 5 July, please let us know as soon as possible and provide a description of any samples you will be bringing.

 

Scientific Conference

Wednesday, 4 July

 

Hands-on Demos

Thursday, 5 July

 

Venue

Johannes Kepler University

Institute of Biophysics

Gruberstrasse 40

A-4020 Linz

(Main Seminar Room, Basement)

 

Chairs

Prof. Dr. Jürgen Smoliner

Vienna University of Technology

 

Prof. Dr. Peter Hinterdorfer

Johannes Kepler University

 

Invited Speakers

Dr. rer. nat. habil. Heidemarie Schmidt

Helmholtz Research Center Dresden-Rossendorf

 

Dr. Jesper Wittborn

Infineon Technologies, Munich

 

Dr. Abbasi Gandhi

University of Limerick

 

Dr. Eugen Pavel

Storex Technologies, Bucharest

 

Additional conference speakers include Dr. Ilya V. Pobelov (University of Bern), Dr. Gennady Lubarsky (University of Ulster), Dr. Raul Rodriguez (Chemnitz University of Technology).

 

To register for this exciting and informative event, please Register Here.

 

We look forward to seeing you in Linz this July!

 

Views: 136

Tags: AFM, SPM, STM, conference

Comment

You need to be a member of The International NanoScience Community to add comments!

Join The International NanoScience Community

Next partner events of TINC

We are Media Partner of:

Welcome - about us

Welcome! Nanopaprika was cooked up by Hungarian chemistry PhD student in 2007. The main idea was to create something more personal than the other nano networks already on the Internet. Community is open to everyone from post-doctorial researchers and professors to students everywhere.

There is only one important assumption: you have to be interested in nano!

Nanopaprika is always looking for new partners, if you have any idea, contact me at editor@nanopaprika.eu

Dr. András Paszternák, founder of Nanopaprika

Publications by A. Paszternák:

Pd/Ni Synergestic Activity for Hydrogen Oxidation Reaction in Alkaline Conditions

The potential use of cellophane test strips for the quick determination of food colours

pH and CO2 Sensing by Curcumin-Coloured Cellophane Test Strip

Polymeric Honeycombs Decorated by Nickel Nanoparticles

Directed Deposition of Nickel Nanoparticles Using Self-Assembled Organic Template,

Organometallic deposition of ultrasmooth nanoscale Ni film,

Zigzag-shaped nickel nanowires via organometallic template-free route

Surface analytical characterization of passive iron surface modified by alkyl-phosphonic acid layers

Atomic Force Microscopy Studies of Alkyl-Phosphonate SAMs on Mica

Amorphous iron formation due to low energy heavy ion implantation in evaporated 57Fe thin films

Surface modification of passive iron by alkylphosphonic acid layers

Formation and structure of alkylphosphonic acid layers on passive iron

Structure of the nonionic surfactant triethoxy monooctylether C8E3 adsorbed at the free water surface, as seen from surface tension measurements and Monte Carlo simulations