Atomic Force Microscopy Seminars on Line!

 

Agilent Technologies invites you to attend our scientific e-Seminars. These exclusive one-hour live events provide a great opportunity to learn about some of the latest atomic force microscopy (AFM) techniques and applications. There will also be Q&A sessions in which all online attendees can query the presenters directly.

 

Register now for one or more of these informative events!

 

 

"New Cantilevers for Basic & Advanced AFM"

 

Date:              March 30 @ 10:00 a.m. (ET)

 

 

Topic 1:           Back to the Basics: How to Choose the Right Cantilever

 

Song Xu, Ph.D. (Agilent Technologies)

 

We will discuss one of the key fundamental aspects of obtaining a good-resolution AFM image of a sample, that is, how to choose the right cantilever for your application. There are more than 10 cantilever manufacturing companies around the world, each of which produces cantilevers made of different materials, with different coatings, stiffnesses, resonance frequencies, and qualities. We will discuss how to understand the parameters of a cantilever, which cantilever to choose, how to judge the quality of the tip, and how to take advantage of uniquely designed cantilevers.

 

Topic 2:            Advanced AFM Probes, Probes for Special Applications & New Tip Developments

 

Oliver Krause, Ph.D. (NanoWorld Group)

 

Besides "everyday use" AFM probes, there is a large variety of brand new tips and cantilevers now available for special applications. Many of these advanced AFM probes will be presented in this seminar. An overview of tips and cantilevers for exceptional or novel AFM applications (such as nanoindentation probes, cantilevers for imaging at higher harmonics, and tips for high-speed AFM) will be given.

 

"A Double Feature for Film Buffs"

 

Date:               April 7 @ 10:00 a.m. (ET)

 

 

Topic 1:            High-Resolution Characterization of Organic Ultrathin Films Using AFM

 

Jing-jiang Yu, Ph.D. (Agilent Technologies)

 

High-resolution characterization of organic ultrathin films and related materials using AFM provides a better understanding of interfacial structures and local properties. Various types of samples - including self-assembled monolayers (SAMs), polymers, and few-layer graphene (FLG) - are investigated with the Agilent 5600LS AFM system. Recent AFM examination results of high-throughput fabrication of SAM nanostructures via nonconventional lithography methods will also be shown.

 

Topic 2:            Atomic Force Acoustic Microscopy - One Tool, Multiple Applications

 

Malgorzata Kopycinska-Mueller, Ph.D. (IZFP-Dresden)

 

                        The atomic force acoustic microscopy (AFAM) technique employs resonance frequencies
                        of an AFM cantilever contacting a sample surface to determine its elastic properties. It is a
                        highly sensitive and versatile tool that can be used in a variety of applications. It is able to
                        work in imaging as well as spectroscopy mode providing us with information on the elastic
                        properties of the sample with nanoscale spatial resolution. It can be used to detect the
                        presence of self assembled monolayers as well as ferroelectric domains. The AFAM
                        method has been also used to detect subsurface defects, changes in the film-substrate
                        adhesion, and to determine elastic properties of films with thicknesses in the nm range.

 

 

 

 

Join us for one or more of these exciting live events!

 

Register

 

Agilent e-Seminars feature a user-friendly, web-based conferencing system that allows you and your colleagues to take part in real-time, interactive presentations on subjects that are pertinent to your work.

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Publications by A. Paszternák:

The potential use of cellophane test strips for the quick determination of food colours

pH and CO2 Sensing by Curcumin-Coloured Cellophane Test Strip

Polymeric Honeycombs Decorated by Nickel Nanoparticles

Directed Deposition of Nickel Nanoparticles Using Self-Assembled Organic Template,

Organometallic deposition of ultrasmooth nanoscale Ni film,

Zigzag-shaped nickel nanowires via organometallic template-free route

Surface analytical characterization of passive iron surface modified by alkyl-phosphonic acid layers

Atomic Force Microscopy Studies of Alkyl-Phosphonate SAMs on Mica

Amorphous iron formation due to low energy heavy ion implantation in evaporated 57Fe thin films

Surface modification of passive iron by alkylphosphonic acid layers

Formation and structure of alkylphosphonic acid layers on passive iron

Structure of the nonionic surfactant triethoxy monooctylether C8E3 adsorbed at the free water surface, as seen from surface tension measurements and Monte Carlo simulations