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Online AFM Seminars Teach Important, Practical Lessons!

Agilent Technologies invites you to attend a very special pair of scientific e-Seminars aimed at providing helpful information about some key basics of atomic force microscopy (AFM). These exclusive one-hour live events, designed to educate researchers who are new to AFM technologies and techniques, will be led by Agilent senior application scientist Dr. Song Xu. All online attendees can query the presenter directly during open Q&A sessions.

Register now for one or both of these highly informative seminars!

Date: September 27, 2011 11a.m.

Topic: Basic AFM Image Processing: Techniques, Theories, and Examples

Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) images contain many levels of information, as well as many potential problems such as noise, misalignment, disturbance, spike, tilt, bow, and various artifacts. After acquiring an image, AFM users need to process and export the raw data into a format that can be utilized for publication and presentation. An appropriate chain of processing, filtering, and rendering allows each AFM user to display data in a way that reveals the most information via the best looking image.

We will present several steps of the basic processing that almost every image must undergo, as well as a few more advanced image processing techniques. First we will discuss a series of basic data processing steps, including plan flatten, plan de-parabola, smooth filter, median filter, FFT filter, high pass filter, and low pass filter. Then we will discuss several data rendering techniques, including 2D topography, 3D topography, and 3D topography with overlay texture mapping. Practical "real world" examples will be presented, as will the image processing's physics and math.

Date: October 18 11 a.m.

Topic: Answering Really Basic Questions that AFM Novice Users Are
Afraid to Ask

New AFM instrument owners often have many important questions that are not usually addressed in publications, books, and presentations: "What are the basic laboratory requirements for the instrument? What might I do that could accidentally damage the instrument? What kind of maintenance does the instrument need on a daily basis?"

We will answer many questions about basic laboratory requirements and procedures, as well as proper instrument usage and maintenance. Some of these practices are unique to AFM, such as remedies for noise-related issues and scanner calibration and adjustment, whereas some practices can be applied to other research instruments, such as strategies for dealing with thermal drift, preventing sample contamination, and ensuring a good working environment.

Join us for one or both of these exciting live events!


Agilent e-Seminars feature a user-friendly, web-based conferencing system that allows you and your colleagues to take part in real-time, interactive presentations on subjects that are pertinent to your work.

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Publications by A. Paszternák:

Smartphone-Based Extension of the Curcumin/Cellophane pH Sensing Method

Pd/Ni Synergestic Activity for Hydrogen Oxidation Reaction in Alkaline Conditions

The potential use of cellophane test strips for the quick determination of food colours

pH and CO2 Sensing by Curcumin-Coloured Cellophane Test Strip

Polymeric Honeycombs Decorated by Nickel Nanoparticles

Directed Deposition of Nickel Nanoparticles Using Self-Assembled Organic Template,

Organometallic deposition of ultrasmooth nanoscale Ni film,

Zigzag-shaped nickel nanowires via organometallic template-free route

Surface analytical characterization of passive iron surface modified by alkyl-phosphonic acid layers

Atomic Force Microscopy Studies of Alkyl-Phosphonate SAMs on Mica

Amorphous iron formation due to low energy heavy ion implantation in evaporated 57Fe thin films

Surface modification of passive iron by alkylphosphonic acid layers

Formation and structure of alkylphosphonic acid layers on passive iron

Structure of the nonionic surfactant triethoxy monooctylether C8E3 adsorbed at the free water surface, as seen from surface tension measurements and Monte Carlo simulations

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