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Join Us Online for New AFM Seminars this October and November!
Agilent Technologies invites you to attend an exciting new series of technique- and application-focused atomic force microscopy (AFM) e-Seminars. Presentation topics include the latest advances in scanning microwave microscopy (SMM), the utilization of AFM to perform in situ studies of lithium ion batteries, and how to leverage the physics associated with AFM to your advantage. These exclusive one-hour live events will be led by scientists based in Switzerland, Austria, and the United States. All online attendees can query the presenters directly during open Q&A sessions.
Register now for one or more of these novel and dynamic seminars!
October 14 @ 10:00 a.m. ET
Presenter 1: Johannes Hoffmann, Ph.D. (Swiss Federal Institute of Technology Zurich)
Title: A Calibration Algorithm for Nearfield Scanning Microwave Microscopes
In this talk, a new algorithm for the calibration of nearfield scanning microwave microscopes will be presented. By adopting techniques known from vector network analyzer calibration, a nearfield scanning microwave microscope can be calibrated at a specific microwave frequency with three standards. The advantages over existing calibration methods are (i) the calibration is valid for all possible samples and (ii) the measurements require less time than other algorithms.
Presenter 2: Ferry Kienberger, Ph.D. (Agilent Research Labs, Austria)
Title: Scanning Microwave Microscopy - Dopant Profiling, Spectroscopy, and Modeling
Scanning microwave microscopy is a recent development in nanoscale imaging techniques that combines the lateral resolution of atomic force microscopy with the high measurement precision of microwave analysis at GHz frequencies. It consists of an atomic force microscope interfaced with a vector network analyzer. We will present the basic working principles of scanning microwave microscopy as well as advanced applications. Calibrated capacitance and resistance measurements are shown with a noise level of 1 aF. Calibrated dopant profiles are measured from 10E14 to 10E20 atoms/cm3 for nano-electronics characterization. Pointwise capacitance-voltage spectroscopy curves are acquired, allowing the characterization of oxide quality, interface traps, and memory effects of novel materials.
October 29 @ 10:00 a.m. ET
Presenter: Song Xu, Ph.D. (Agilent Technologies)
Title: In Situ Imaging and Mechanical Property Study of a Lithium Ion Battery Using
AFM in a Low-Oxygen, Low-Moisture Environment
Lithium ion battery research is attracting wide interest among researchers. To understand the fundamentals of battery performance, it is important to observe the formation and properties of solid electrolyte interphase (SEI), in situ, in an EC cell setting. It is known that the in situ AFM observation of the SEI in an EC cell has many difficulties. Lithium metal and the electrolyte used in lithium batteries are very sensitive to environmental factors such as oxygen and moisture. Installing an AFM inside a low-oxygen, low-moisture glove box creates further challenges. A simple operation in a normal laboratory setting becomes difficult when attempted in a glove box. In this seminar, we will analyze the scientific and technical challenges of such experiments, including vibration isolation inside a glove box, a modified EC cell for easy-to-install lithium electrodes, and the modifications required to make experiments easy to perform with gloves on. We will also demonstrate data that reveals the formation and evolution of the SEI on highly ordered pyrolytic graphite (HOPG) and other electrode materials. Extended CV and in situ AFM imaging show that the formation of the SEI is not a single layer growth. The SEI initially forms on the surface of HOPG as a single layer and as we ramp down the CV potential the single layer becomes two layers, with observable delamination happening between them. Mechanical properties of the SEI are studied using AFM-tip-based nanoindentation and data will be analyzed via a software plug-in to obtain the mechanical mapping and evolution of the SEI.
November 12 @ 10:00 a.m. ET
Presenter: Song Xu, Ph.D. (Agilent Technologies)
Title: Basic Physics of Atomic Force Microscopy Session III
The research and development of atomic force microscopy has been very rapid during the past two decades. Every once in a very short while, a new imaging "mode" is created, published, marketed and promoted by various research groups and companies. Sometimes, similar imaging contrast mechanisms are described by different researchers and companies with very different names. Therefore, as a user of an AFM instrument, it is sometimes overwhelming and confusing to choose between dozens of imaging "modes" and trying to tell the differences. In this e-seminar, we will again visit the basic physics of atomic force microscopy imaging mechanisms. The goal is to help AFM researchers, technicians and scientists to analyze, understand the basics physics of their research problems and at the same time, we will analyze imaging "modes", and how to make the correct choice for a specific application/research problem.
Join us for one or more of these highly informative live events!
Register
Agilent e-Seminars feature a user-friendly, web-based conferencing system that allows you and your colleagues to take part in real-time, interactive presentations on subjects that are pertinent to your work.
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