New FE-SEM & AFM Techniques Offer Unprecedented Glimpse into Graphene!

Latest webinar from Agilent Technologies

Agilent Technologies

New FE-SEM & AFM Techniques Offer
Unprecedented Glimpse into Graphene!

Wednesday, May 23, 2012 - 15:00 UTC
08:00 PT / 11:00 ET / 16:00 UK / 17:00 CET

Click here to check the time in your own country >>>

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Join application scientists Dr Jining Xie and Dr Song Xu of Agilent Technologies for a unique scientific webinar in May detailing brand new techniques for exploring the properties of graphene at the nanoscale!

First, imaging of graphene on different substrates via low-voltage field emission scanning electron microscopy will be demonstrated. Various FE-SEM imaging modes are utilized to study surface morphology at a broad range of magnifications; tuning the beam voltage (down to 500 V) controls charging problems caused by the insulating substrates.

Next, the use of 'frequency modulation electrostatic force' will be described. This FM-KFM technique reveals electrical potential variation generated by the contact interface between the graphene and substrate. Combining signal contrast from multiple channels, AFM’s ability to study/identify graphene without optical methods will be demonstrated.

Your presenters...

Dr Jining XieDr Jining Xie
SEM application engineer
Agilent Technologies

Dr Song XuDr Song Xu
Applications Scientist
Agilent Technologies

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