P Y R E X - N I T R I D E - A F M - P R O B E S

Leading edge in sharpness and durability

General

• SPM and AFM probes for wide range of applications in contact
  mode or dynamic mode
• fits to all well-known commercial SPMs and AFMs
• silicon nitride cantilevers and tips
• cantilevers are supported by a support chip made of pyrex-glass
• delivery as separated single support chips for easy handling

Material Features

• low-stress silicon nitride for lowest cantilever bending
• excellent hardness for wear resistance and extended lifetime

Cantilevers

• multi-lever design with either four rectangular cantilevers or four triangular
  cantilevers
• reflective chromium/gold coating on the backside of the cantilevers
• stress compensated with bending below 2°

Support Chip

• support chips made of pyrex-glass (3.4 mm x 1.6 mm x 0.5 mm)
• easy handling due to single support chips

Tips

• oxide sharpened pyramidal probe tips
• tip height 3.5 ~m and tip radius of curvature typically < 10 nm
• macroscopic half-cone angle 35°
• tipless versions also available

Coatings

• 65 nm thick chromium/gold coating on the backside of the cantilevers
• enhances reflectance of the laser beam
• 35 nm thick chromium/gold coating on both sides of the scanning probe