NanoAndMore presents NanoWorld AFM probes for ultra high speed scanning



The most often used standard probe for ultra-high speed scanning is the NanoWorld A R R O W ™ UHF

The Arrow™ UHF
(Ultra High Frequency) is a silicon SPM and AFM probe with a tetrahedral tip and a triangular cantilever capable of resonating with an ultra high frequency of up to
2.0 MHz. On request, specific cantilever thicknesses are selected within very narrow tolerances for
an extra selection fee.
The Arrow UHF is optionally also available wth a gold reflex coating.
For more developments for the emerging field of
high speed scanning please have a look below.
Cantilever 3D View
Cantilever 3D View
Cantilever Top View
Cantilever Top View
Tip Front View
Tip Front View
Tip Detail
Tip Detail

Support Chip 3D View
Support Chip 3D View

U l t r a - S h o r t - A F M - C a n t i l e v e r s

Next generation of AFM Probes for High Speed Scanning


  • development of very short, narrow and thin cantilevers with Electron Beam Deposited
    (EBD) tip for High Speed Scanning applications for present and future AFM systems
  • different cantilever materials are evaluated:
    Si (poly/single crystal/111), SiN, New Material ("NM")
  • joint development between NanoWorld AG and nanotools GmbH

Description of Ultra-Short-AFM-Cantilevers (USC) made of New Material


  • different prototypes of Ultra-Short cantilevers have been developed and
    fabricated resulting in different mechanical properties:

calculated values

Resonance Frequency [kHz] 5000 2000 1500 330 1300 1250 500
Force Constant [N/m] 30 3.0 0.6 0.3 1.2 7.8 0.75
CB length [m] 10 10 7 20 10 20 20
CB width [m] 5 5 3 10 5 10 10
CB thickness [nm] 680 280 100 190 190 680 280
Highlighted are the versions considered for commercialization in a first step


  • nanotools® High Dense Carbon (HDC) tip with the following dimensions:
    Height: > 2.0 m (typically 2.5
    Tip radius: < 10 nm
    Aspect ratio: approx. 1:5
    Tilt compensation: 8±1 deg

Support chip

  • dimensions of the Si support chip are very reproducible (1.6 mm x 3.4 mm)
  • etched and lowered corners of the Si support chip avoid contact
    between the Si support chip and the sample


  • 30 nm Gold reflex coating on both sides of the cantilevers (tip uncoated)


  • prototypes available (have been validated by external tests)
  • pre-production status: more than 50 wafers have been fabricated
  • ongoing beta testing

More information on

For more information you can visit

Views: 35

Tags: AFM, SPM-week


You need to be a member of The International NanoScience Community to add comments!

Join The International NanoScience Community

Latest Activity

Full member
TINC posted a blog post
25 minutes ago
Dr. Irshad A Wani is now a member of The International NanoScience Community
Profile IconThe International NanoScience Community via Facebook

Only 127 likes needed to 6000. Can you help us?

Facebookyesterday · Reply
Profile IconThe International NanoScience Community via Facebook

Kutatók a Neten -

Amíg a bloggerek, weblapszerkesztők jelentkeznek a…

See More
Facebookyesterday · Reply

Welcome - about us

Welcome! Nanopaprika was cooked up by Hungarian chemistry PhD student in 2007. The main idea was to create something more personal than the other nano networks already on the Internet. Community is open to everyone from post-doctorial researchers and professors to students everywhere.

There is only one important assumption: you have to be interested in nano!

Nanopaprika is always looking for new partners, if you have any idea, contact me at

Dr. András Paszternák, founder of Nanopaprika

Publications by A. Paszternák:

Smartphone-Based Extension of the Curcumin/Cellophane pH Sensing Method

Pd/Ni Synergestic Activity for Hydrogen Oxidation Reaction in Alkaline Conditions

The potential use of cellophane test strips for the quick determination of food colours

pH and CO2 Sensing by Curcumin-Coloured Cellophane Test Strip

Polymeric Honeycombs Decorated by Nickel Nanoparticles

Directed Deposition of Nickel Nanoparticles Using Self-Assembled Organic Template,

Organometallic deposition of ultrasmooth nanoscale Ni film,

Zigzag-shaped nickel nanowires via organometallic template-free route

Surface analytical characterization of passive iron surface modified by alkyl-phosphonic acid layers

Atomic Force Microscopy Studies of Alkyl-Phosphonate SAMs on Mica

Amorphous iron formation due to low energy heavy ion implantation in evaporated 57Fe thin films

Surface modification of passive iron by alkylphosphonic acid layers

Formation and structure of alkylphosphonic acid layers on passive iron

Structure of the nonionic surfactant triethoxy monooctylether C8E3 adsorbed at the free water surface, as seen from surface tension measurements and Monte Carlo simulations

Next partner events of TINC

We are Media Partner of: