Nano-Scale Materials Characterisation Residential Weekend

Become familiar with the latest characterisation methods at the University of Oxford’s Begbroke Science Park and at the Department of Materials.

Over the two days (30 June - 1 July 2018), the presentations, discussions and demonstrations focus on characterisation and problem-solving in surface and interface science and technology as well as characterisation of nanoparticles and nanostructures. In particular, the following groups of techniques are considered:

  • Surface specific electron spectroscopic (XPS) and spectrometric (SIMS) techniques;
  • Electron-optical analytical and imaging (EPMA/WDS, SEM/EDS, TEM/EDS, HRTEM) techniques;
  • Photon spectroscopic (IR and Raman probes) and thin-film profilometry techniques;
  • Scanning probe (AFM in various operational modes) and stylus (Dektak) techniques;
  • Light scattering for particle characterisation (particle analysis, dynamic light scattering, centrifugal sedimentation, laser diffraction).

Contact nano@conted.ox.ac.uk for more details

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