The NanoCharacterisation Platform (PFNC) comprises more than 40 state-of-the-art characterization tools, operated by 80 researchers, technicians and students. This platform, unique in Europe and supported by three institutes of the CEA Grenoble (LETI, LITEN and INAC), is dedicated to the development of new characterization techniques for Nanoscience, semiconductor nanotechnologies and materials for energy, and to provide resources and expertise to support the programs of the CEA and its partners. In addition to these priority tasks we also participate in national and international programs with manufacturers, suppliers and academic partners, and train students and postgraduates. The instruments and expertise of the PFNC institutes are organized into competence centers (CdC): analysis by ion beam, X-ray, surface analysis, electron and near-field microscopies, optical characterization, analysis of mechanical properties and sample preparation.

In this context, we are looking for a scientist to strengthen the electron-microscopy competence center (for more details open the pdf below).

At the PFNC, such as a monochromated FEI Titan3 Ultimate TEM, with image and probe correctors, GATAN energy filter are available. Additional TEMs available include a probe corrected FEI Titan Themis and a FEI Tecnai Osiris both with ChemiSTEM, a FEI Tecnai and a JEOL 2010 FEF equipped with precession electron diffraction module ASTAR from Nanomegas. We also have three different dual beam focused ion beam (FIB) systems, a Xe ion Plasma FIB as well as tools such as Atom Probe, SIMS, Scanning probe, XPS and a range of analytical SEMs….

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