Imec’s Fab Technology Unit is looking for a m/f Materials Characterization Engineer Transmission Electron Microscopy.
Job description
The Semiconductor industry is driven by transistor down-scaling that provides the end-user with ever faster and less power using computer chips resulting in richer featured consumer products at affordable pricing. Measuring these small dimensions which are in the order of nano-meter is a challenge, and is even more so because of new materials besides silicon that are needed in these transistors. Not only dimensional analysis is needed, also chemical analysis and defects analysis at the atomic level. Transmission Electron Microscopy (TEM) of thin specimens is using a suite of techniques such as Scanning TEM (STEM,) Electron Energy Loss Spectroscopy (EELS) and x-ray energy dispersive analysis (EDS) allowing to study materials properties at the level of the atomic scale.
Your task will be to support – and depending on your level of expertise – to guide process development teams by executing and interpreting TEM measurements. You will prepare the samples starting from single dies, using focused ion beam resulting in a thin specimen, observe these in the transmission electron microscope, analyze critical dimensions features, materials defects, and determine chemical composition of stacks. You will generate a comprehensive report that allows the process teams to use these observations to advance their development work.
All these tasks will need to be done, after a period of training depending on your initial level of expertise, in an accurate and independent way, working in a rotating shift regime to assure an optimal use of the equipment resources.
Profile
You obtained a master or PhD in materials sciences, physics, chemistry or bio-physics, and having one or more years of relevant experience in transmission electron microscopy in a university or industrial R&D lab environment is an asset. You are a good communicator, team player, and eager to learn. Your tasks are TEM sample preparation by focused ion beam, TEM observation, analytical STEM, EDS mapping analysis. Good report writing skills, good analytical skills and desire to learn more about new semiconductor materials and advanced structures are essential for a successful implementation of this role. Depending on the level of experience, you will also have a broader role in analyzing the incoming TEM requests and reviewing characterization reports prepared by other researchers / engineers. Specific trainings with the available configuration of TEM/FIB tools at imec is foreseen at the start of your assignment.
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