Lehigh Univ.'s Unique Surface Science Technologies


Free Attendance  |  March 23, 2011  |  1:00 - 5:00 p.m.  |  Whitaker Auditorium 303

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Lehigh University is unveiling to the academic and industrial research community two new technologies that will add significantly to national and regional nanoscale surface science and analysis capabilities.

The recently-installed ION-TOF Qtac 100 High Sensitivity-Low Energy Ion Scattering (HS-LEIS) (bottom right) provides users with unprecedented surface analysis technique -- isolating and examining the very top or outer atomic layer, just 0.2 to 0.3 nm thick.

The Scienta ESCA 300 (top left), one of 11 in the world and the only one in the U.S., is among the most powerful instruments available for such research. With this instrument, Lehigh and visiting researchers can glean information about the top 10 atomic layers of a material.

Simply put, it's technology that doesn't exist anywhere else in the Western hemisphere.

To learn more about this exciting new nanoscale technology and some of its emerging applications, please register to attend the Symposium. If you cannot attend, please use the "Video Request" link to indicate that you'd like us to notify you when the video of the lectures becomes available.

Attendance is FREE, however, please register by visiting the Symposium Web site.

Please also visit the site if you are unable to attend, but would like for us to
notify you when the Symposium video is available.

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Atomic Force Microscopy Studies of Alkyl-Phosphonate SAMs on Mica

Amorphous iron formation due to low energy heavy ion implantation in evaporated 57Fe thin films

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