***INVITATION TO ATTEND***
Free Attendance | March 23, 2011 | 1:00 - 5:00 p.m. | Whitaker Auditorium 303
Click here for registration or to receive post-event video
The recently-installed ION-TOF Qtac 100 High Sensitivity-Low Energy Ion Scattering (HS-LEIS) (bottom right) provides users with unprecedented surface analysis technique -- isolating and examining the very top or outer atomic layer, just 0.2 to 0.3 nm thick.
The Scienta ESCA 300 (top left), one of 11 in the world and the only one in the U.S., is among the most powerful instruments available for such research. With this instrument, Lehigh and visiting researchers can glean information about the top 10 atomic layers of a material.
Simply put, it's technology that doesn't exist anywhere else in the Western hemisphere.
To learn more about this exciting new nanoscale technology and some of its emerging applications, please register to attend the Symposium. If you cannot attend, please use the "Video Request" link to indicate that you'd like us to notify you when the video of the lectures becomes available.