Atomic Force Microscopy Webinar Series

AFM Enhancing Traditional Electron Microscopy Applications

Presenter: Johannes Kindt, Ph.D., Senior Engineer

Webinar Date & Time

Wednesday, April 11, 2012
8:00 AM PST*

Register for the Broadcast

Webinar Overview

Atomic Force Microscopy (AFM) has traditionally been limited to specialty applications where its capability to provide unique information outweighed its relatively slow speed and difficult operation.

The latest generation of AFM combines highest resolution scans in a fraction of a minute, self-optimizing imaging at nm-resolution, a large, fully automatable sample stage for multiple samples with easy access, and an intuitive, workflow-oriented user interface, to overcome these limitations.

The latest AFMs:
• work with native, sectioned, stained, and all common EM sample preps
• enable nanoscale imaging of dynamic changes over time,
• provide true nano-metrological information in all three sample dimensions,
• map quantitative mechanical properties (modulus, adhesion, dissipation) with nm resolution, on materials down to 1MPa, providing material contrast for typical “light element” materials

The live broadcast will include a fully-interactive Q&A session to answer your applications questions. Register today to reserve your seat.

Please join us for an exciting webinar about the possibilities of current AFMs on traditional Scanning and Transmission Electron Microscopy topics.

Sincerely,
Your AFM Webinar Series Team

*All times given are for PST (Pacific Standard Time, USA & Canada).
Check your local times when registering.