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Advanced Phase ID Using Combined EBSD and EDS on SEM
is being held on
Wednesday 11 January 2012
at 4pm (UK), 5pm (CET) and 11am (EDT)
Outline:
Electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). They are complementary techniques and provide structural and compositional information respectively. Building on its recent developments in integrating EBSD and EDS, Bruker is now releasing an advanced phase identification feature. This new method significantly increases efficiency when dealing with multiphase materials and allows experts as well as less experienced users to acquire the best quality results.
The webinar will focus on describing the new phase identification procedure and its advantages compared to the common phase identification method.
Our experts will present numerous materials and earth science application examples.
Who should attend?
Researchers working in electron microscopy labs studying crystalline materials
Materials and earth science lecturers and students
EBSD users interested in advanced applications of the method
Presenter:
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Dr. Laurie Palasse Laurie holds a PhD in Geosciences from Utrecht University, The Netherlands. She has extensive experience in electron microscopy and EBSD, since 2002 she has been working with these techniques. In 2008 she joined Oxford Instruments as an EBSD Technical Specialist, in charge of application and technical EBSD support, 2D and 3D EBSD. Since 1 September Laurie is an Application Scientist EBSD with Bruker Nano in Berlin, Germany. |
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Dr.Daniel Goran Daniel acquired his Ph.D. at Metz University, France. He studied the influence of severe plastic deformation on texture and microstructure of metals. From 2007 to 2009 he worked as an EBSD Application Scientist at Oxford Instruments HKL in Hobro, Denmark. Since June 2009 he has been an EBSD Application Scientist at Bruker Nano in Berlin. |
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