On December 16th, Agilent will host a one-hour AFM eSeminar focusing on a brand new, highly sensitive imaging technique, scanning microwave microscopy (SMM) mode. This is the first and only imaging method to combine the calibrated, complex electrical measurement capabilities of a microwave performance network analyzer (PNA) with the outstanding spatial resolution of an atomic force microscope. SMM Mode outperforms traditional AFM-based scanning capacitance microscopy techniques, offering the ability to acquire quantitative results, the highest sensitivity and dynamic range in the industry, and far greater application versatility.

“Expanding Impedance Measurements to the Nanoscale:
Coupling the Power of Scanning Probe Microscopy with the PNA”

Live event: Tuesday, December 16, 2008
Duration: 1 hour
Register here

Presenters: Craig Wall (Agilent Technologies), Hassan Tanbakuchi (Agilent Labs)

SMM Mode provides researchers in the material sciences, semiconductors, and biosciences an important new analytical tool. The eSeminar presentation will define SMM Mode and summarize the technical challenges faced when developing this technology, namely, how to measure minute changes of highly reflective vector network analyzer load impedance and decoupling of the mechanical motion from the RF cable. The latest results will be shown, followed by a discussion of potential future scientific disciplines for which this technology might be useful. The presenters will also cover how the SPM works and its combination with the PNA to make capacitance measurements via the SPM probe as well as dC/dV measurements for dopant profiling

There will be a Q&A session in which all online attendees are welcome to query the presenters.

Agilent eSeminars feature a user-friendly, web-based conferencing system that allows you and your colleagues to take part in real-time, interactive presentations on subjects that are pertinent to your work.

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Publications by A. Paszternák:

Smartphone-Based Extension of the Curcumin/Cellophane pH Sensing Method

Pd/Ni Synergestic Activity for Hydrogen Oxidation Reaction in Alkaline Conditions

The potential use of cellophane test strips for the quick determination of food colours

pH and CO2 Sensing by Curcumin-Coloured Cellophane Test Strip

Polymeric Honeycombs Decorated by Nickel Nanoparticles

Directed Deposition of Nickel Nanoparticles Using Self-Assembled Organic Template,

Organometallic deposition of ultrasmooth nanoscale Ni film,

Zigzag-shaped nickel nanowires via organometallic template-free route

Surface analytical characterization of passive iron surface modified by alkyl-phosphonic acid layers

Atomic Force Microscopy Studies of Alkyl-Phosphonate SAMs on Mica

Amorphous iron formation due to low energy heavy ion implantation in evaporated 57Fe thin films

Surface modification of passive iron by alkylphosphonic acid layers

Formation and structure of alkylphosphonic acid layers on passive iron

Structure of the nonionic surfactant triethoxy monooctylether C8E3 adsorbed at the free water surface, as seen from surface tension measurements and Monte Carlo simulations

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