On December 16th, Agilent will host a one-hour AFM eSeminar focusing on a brand new, highly sensitive imaging technique, scanning microwave microscopy (SMM) mode. This is the first and only imaging method to combine the calibrated, complex electrical measurement capabilities of a microwave performance network analyzer (PNA) with the outstanding spatial resolution of an atomic force microscope. SMM Mode outperforms traditional AFM-based scanning capacitance microscopy techniques, offering the ability to acquire quantitative results, the highest sensitivity and dynamic range in the industry, and far greater application versatility.


“Expanding Impedance Measurements to the Nanoscale:
Coupling the Power of Scanning Probe Microscopy with the PNA”

Live event: Tuesday, December 16, 2008
3PM GMT; 4PM CET
Duration: 1 hour
Register here


Presenters: Craig Wall (Agilent Technologies), Hassan Tanbakuchi (Agilent Labs)

SMM Mode provides researchers in the material sciences, semiconductors, and biosciences an important new analytical tool. The eSeminar presentation will define SMM Mode and summarize the technical challenges faced when developing this technology, namely, how to measure minute changes of highly reflective vector network analyzer load impedance and decoupling of the mechanical motion from the RF cable. The latest results will be shown, followed by a discussion of potential future scientific disciplines for which this technology might be useful. The presenters will also cover how the SPM works and its combination with the PNA to make capacitance measurements via the SPM probe as well as dC/dV measurements for dopant profiling

There will be a Q&A session in which all online attendees are welcome to query the presenters.

Agilent eSeminars feature a user-friendly, web-based conferencing system that allows you and your colleagues to take part in real-time, interactive presentations on subjects that are pertinent to your work.

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