Bruker AFM Webinar Series

Utilizing AFM Force Control Modes For Nanoscale Mechanical Property Measurements

Wednesday, July 16, 2014
8AM PT / 4PM GMT Register Here

This month's webinar features Dr. Gheorghe Stan from the National Institute of Standards and Technology.

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Join us as we discuss improvements to the contact geometry analysis for CR-AFM with examples on various materials. We will examine new developments combining CR-AFM with force-controlled modes such as force volume and PeakForce Tapping. This provides new insights for contact mechanics and the mechanics of contact formation and contact breaking. Finally, we will consider the effect of the time dependence of material properties on all of the measurements.

Guest Speaker:

Gheorghe Stan, PhD, Research Scientist, Materials Measurement Science Division of the National Institue of Standards and Technology
Dr. Gheorghe Stan received his PhDs in Physics from the University of Bucharest (Bucharest, Romania) in 2000 and Colorado State University (Fort Collins, CO) in 2005. Since 2005 he has worked at NIST on developing new scanning probe microscopy techniques for nanoscale material property measurements. In particular, his efforts are focused on quantitative measurements of elastic properties of materials at the nanoscale by dynamic scanning probe microscopy techniques, like contact resonance atomic force microscopy. Dr. Stan has more than thirty publications in the field of nanoscale material science.

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8AM PT Registration*

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p.s. The broadcast will include an interactive Q&A session to answer your applications questions. Register today to reserve your seat.