AFM Webinar - High Resolution Quantitative Kelvin Probe Force Microscopy - Aug 22nd

Atomic Force Microscopy Webinar Series - High Resolution Quantitative Kelvin Probe Force Microscopy

Atomic Force Microscopy Webinar Series

High Resolution Quantitative Kelvin Probe Force Microscopy - Principles and Applications

Webinar Date & Time

Wednesday, August 22, 2012

Morning Broadcast, 8:00 AM PDT*


Webinar Presenter - Chunzeng Li, Ph.D.
Presenter Chunzeng Li, Ph.D., Application Scientist

Webinar Overview

Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on the nanometer length scale. Since its first introduction in 1991, KPFM has found use in a wide range of nano-scale electrical characterization applications on metals, semiconductor materials & devices, organic materials & devices and biological samples. It has proven itself to be a unique and valuable tool.

Despite much effort, KPFM has suffered from its inability to obtain consistent measurements of absolute work-functions in ambient conditions. Contamination, oxidation, and tip-induced electrochemical reactions are all at play and make repeatable quantitative measurements a daunting challenge. Even under ultra-high vacuum, tip-wear can lead to large measurement uncertainty both over time and from probe to probe.

In our new probe and instrument designs, we have found ways to reduce probe to probe measurement scatter to below a standard deviation of 50 mV. This represents a major advance towards quantitative work function measurement, which in turn expands KPFMs utility in ever demanding applications.

The live broadcast will include an interactive Q&A session to answer all of your applications questions. Register today to reserve your seat.

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Morning Broadcast, 8:00 AM PDT*


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*All times given are for PDT (Pacific Daylight Time, USA & Canada).
Check your local times when registering.

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