LensAFM Webinar:

  Advancements in Instrumentation for

  Surface Inspection and Defect Analysis

  Webinar Date: 09 May 2012…

Atomic Force Microscopy Webinar Series

AFM…

NT-MDT is happy to invite to the webinar “Tip-Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging” by Dr. Pavel Dorozhkin.

Tip-Enhanced Raman Scattering (TERS) is the technique utilizing a special AFM probe (nano-antenna) to localize light at the nanometer scale area near the probe apex. When scanning the sample with respect to the probe, the obtained optical (Raman or fluorescence) maps have lateral resolution which is not limited by the light…

T-MDT is happy to invite you to the webinar  “Tip Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging” by Dr. Pavel Dorozhkin.



Tip Enhanced Raman Scattering (TERS) is the technique utilizing a special AFM probe (nano-antenna) to localize light at the nanometer scale area near the probe apex. When scanning the sample with respect to the probe, the obtained optical (Raman or fluorescence) maps have lateral resolution which is not limited by the light…

Atomic Force Microscopy Webinar Series…

Asylum Research Webinar Series 2012

February 22 Webinar

"Smaller and Quieter: Ultra-high Resolution AFM Imaging"

Miniaturization of…

Advanced Phase ID Using Combined EBSD and EDS on SEM

is being held on

Wednesday 11 January 2012

at 4pm (UK), 5pm (CET) and 11am (EDT)…

We are launching a series of online short courses on nanoscience and nanotechnology that will be offered over the next couple of years. This initiative builds on the open content we have on nanoHUB.org. We think the approach is unique - the courses are designed to be broadly accessible without many prerequisites, and the material is presented in an original way. Students get access to a completely new set of lectures not available on nanoHUB, extensive lecture notes, exams, homeworks, Q…

Atomic Force Microscopy Webinar Series

The…

SEM like user experience, True 3D nanometrology

and quantitative material property mapping in ambient, fluid, and controlled environments

is being held on

Wednesday, 07 December 2011…

Atomic Force Microscopy Webinar Series

In Situ Monitoring of Lithium Battery

Electrode Processes Using Integrated Atomic Force…

Leica Microsystems

Free Online Web Seminar

Free Educational Webinar about Sample Preparation

for Scanning Electron Microscopy:

State of the Art Critical Point Drying with the new

fully automated Leica EM CPD300

being held on

Tuesday, 25 October 2011

at 08:00…

Survey, Screening, Dynamics:

High-Speed AFM Imaging with

Bruker's Dimension FastScan^TM AFM