TINC's Blog Posts Tagged 'AFM' (58)

Highly Practical AFM Skills To Be Taught Online!

Agilent Images


Added by TINC on March 20, 2012 at 9:26pm — No Comments

NT-MDT webinar on TERS – 6th of March

T-MDT is happy to invite you to the webinar  “Tip Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging” by Dr. Pavel Dorozhkin.

Tip Enhanced Raman Scattering (TERS) is the technique utilizing a special AFM probe (nano-antenna) to localize light at the nanometer scale area near the probe apex. When scanning the sample with respect to the probe, the obtained optical (Raman or fluorescence) maps have lateral resolution which is not limited by the light…


Added by TINC on March 2, 2012 at 11:04am — No Comments

AFM Webinar Series – The Powerful Diversity of the AFM Probe – March 14th

Atomic Force Microscopy Webinar Series - The Powerful Diversity of the AFM Probe

Atomic Force Microscopy Webinar Series…


Added by TINC on February 29, 2012 at 7:13pm — No Comments

AFM+Raman characterization of Li-ion batteries (NT-MDT digest)

Development of advanced lithium batteries currently represents a very rapidly growing field of science and technology. Lithium batteries are interesting as a power source in numerous portable devices, in electrical vehicles, in military and aerospace applications. What factors determine the cycle life, self-discharge rate, energy density? Optimization needs the complimentary usage of different analytical approaches.

In the attached application note different Li-ion battery…


Added by TINC on February 21, 2012 at 9:16pm — No Comments

Seeing at the Nanoscale 2012 - Call for Papers, Early Bird Registration, more...


Share your research at the world’s leading SPM conference and have your voice heard among your peers and experts in nanotechnology!…


Added by TINC on February 7, 2012 at 11:14pm — No Comments

AFM with Localized Optical Excitation for Solar Cell Studies

investigation and optimization.

In this application note, Kelvin force microscopy was used to measure the surface potential profile of a multijunction solar cell cross-section in relation to the intensity, wavelength, and beam position of a localized optical excitation (~400 nm spot diameter). The response, surface potential variation, of separate subcells was monitored. Experimental results are in good agreement with qualitative simulation.

The results were obtained…


Added by TINC on January 18, 2012 at 10:05pm — No Comments

ProIMAGE Contest 2011

NT-MDT Co. is happy to invite you to participate in the ProIMAGE Contest 2011. The contest is a competition of AFM-images obtained with NT-MDT probes. The submission opens on the 12th of September!

During the ProIMAGE Contest 2009-2010 we received many interesting and rare images. We hope that the ProIMAGE Contest 2011 will also show the beauty and variety of scientific research.

Please inform us if you don't have NT-MDT probes yet. We would be happy to send you free demo… Continue

Added by TINC on September 12, 2011 at 8:27pm — 3 Comments

New Online Seminars for AFM Novices

Agilent Images


Added by TINC on August 22, 2011 at 6:16pm — No Comments

Bruker Seminar during AFM BioMed 2011

 Bruker Life Science Seminar
-Experience the Future of AFM-…

Added by TINC on July 5, 2011 at 7:21pm — No Comments

Euro AFM Forum 2011

ETH Zurich, Atomic Force F&E GmbH and Asylum Research are happy to organize the Euro AFM Forum 2011 in Zurich, Switzerland on September 7th to 9th in cooperation with Prof. Ralph Spolenak at the campus Science City (Hönggerberg) of the Swiss Federal Institute of Technology Zurich (ETH Zürich). With its mixture of talks and instrument workshops the Euro AFM Forum…

Added by TINC on June 8, 2011 at 9:58am — No Comments

Totally integrated SEM/FIB/AFM system

Dear Nanocommunity members,

we would like to inform the community that Danish Micro Engeneering (DME) has developed a new totally integrated SEM/SPM System. The system is based on a Zeiss AURIGA (R) Crossbeam Workstation and the newly developed DME UHV/AFM. The complete hardware and software integration of both systems result in the new Binnig-Rohrer-Ruska microscope (BRR) which opens totally new possibilities in the nano…


Added by TINC on April 28, 2011 at 10:30pm — No Comments

New Scientific AFM e-Seminars

Atomic Force Microscopy Seminars on Line!


Agilent Technologies invites you to attend our scientific e-Seminars. These exclusive one-hour live events provide a great opportunity to learn about some of the latest…


Added by TINC on March 29, 2011 at 10:44pm — No Comments

Don't Miss Tomorrow's AFM Webinar - Register Today

The Bruker AFM Webinar Series Presents

ScanAsyst and PeakForce Tapping



Added by TINC on March 22, 2011 at 11:25pm — No Comments

Agilent - New Scientific AFM e-Seminars in March

Spend March Online: New Atomic Force Microscopy Seminars!



Added by TINC on January 24, 2011 at 10:08pm — No Comments

AFM webinar - High Resolution Imaging with the BioScope Catalyst

Webinar: High Resolution Imaging with the BioScope Catalyst


From nucleic acids and proteins to proteinassemblies and membranes, this webinar (…


Added by TINC on January 13, 2011 at 6:53pm — No Comments

PeakForce Tapping Revolution

New High-Resolution Nanoelectrical AFM Technology Continues

PeakForce Tapping Revolution…

datasheet for PeakForce TUNA


Added by TINC on December 15, 2010 at 11:39pm — No Comments

New Scientific AFM e-Seminars

New Atomic Force Microscopy Seminar!…


Added by TINC on October 1, 2010 at 8:30pm — No Comments


IEMN, a research center of the CNRS (France), organizes a short course that provides specific training in scanning probe microscopy. This short course will be held next November, from November 25 to November 27, in Lille, with the participation of Veeco France. The course, given in the French language, is intended for scientists, technicians, engineers, who desire an introduction to SPM or who want to broaden and update their pratical knowledge on the… Continue

Added by TINC on October 3, 2009 at 11:30am — No Comments

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