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Nanovea 3D Non-Contact Profilometers are designed with leading edge optical pens using superior white light axial chromatism. Nano through macro range is obtained during measurement (Profile/Dimension, Roughness/Finish/Texture, Shape/Form/Topography, Flatness/Warpage, Volume/Area, Step-Height/Depth/Thickness and others) on a wider range of geometries and materials than any other Profilometer. With the use of a large range of optical pens the Profilometer precisely measures an endless range of applications. Nanovea optical pens have zero influence from sample reflectivity, variations require no sample preparation and have advanced ability to measure high surface angles. Easily measure any material: transparent, opaque, specular, diffusive, polished, rough etc. Unlike other optical measurement techniques, large surface areas can be precisely measured without any imaging stitching. For applications exceeding Profilometer capability an AFM integration is available to maximize measurement range. All Profilometers use the same Software and Nanovea PRVision is optional on most Profilometers for auto pattern recognition. Profilometer speeds range from 7mm/s to 1m/s for laboratory or research to the needs of hi-speed inspection on large surface areas. Nanovea Profilometers can be built with custom size, speeds, scanning capabilities, Class 1 Clean Room compliance, with Indexing Conveyor and for Inline or online Integration and now with true portability capability.*For Profilometer specifications see brochure download. For Profilometer technical testing data see application notes. For video visit Nanovea YouTube.