State of the art, bolt-on SIMS probe for integration into your existing UHV surface science chamber.

- Static / Dynamic SIMS with energy analysis

- Integral front end ioniser for RGA

- Composition / contamination analysis

Depth profiling

- Leak detection and desorbed gas analysis

- Compatible with Hiden SIMS Workstation

- Suitable for FIB-SIMS integration

Specification for 1000 Series EQS

- 5x105 cps/nA for 27Al+ from Al target under 5keV Ar+ bombardment

- 100 cps/nA for Cs(CsI)3+ at 913amu from CsI target under 5keV O2+ bombardment

The EQS secondary ion mass spectrometer for the analysis of secondary positive and negative ions from solid samples, featuring:

- High Sensitivity Pulse Ion Counting detector with 7 decade dynamic range.

- Raster Control for enhanced depth profiling and imaging with integrated signal gating.

- 45° Electrostatic Sector analyser, scan energy at 0.05 eV increments/ 0.25eV FWHM.

- Minimum perturbation of ion flight path & constant ion transmission at all energies.

- Triple filter Quadrupole, mass options to 2500 amu.

- Penning Gauge and interlocks to provide over pressure protection.

- Differentially pumped option for use in high pressure environments.

- MASsoft control via RS232, RS485 or Ethernet LAN.

- Easily interfaced to existing systems

Read more…
E-mail me when people leave their comments –

You need to be a member of The International NanoScience Community - Nanopaprika.eu to add comments!

Join The International NanoScience Community - Nanopaprika.eu