Layer on top of the sample which prevents the HRTEM
I had a nanocrystalline powder sample . when i work with the TEM on my sample it forms a layer on top of the sample which is on a copper grid .Which prevents the me to analyse the HRTEM of the sample. I will attach my samaple TEM images can anyone solve this problem?3.jpg4.jpg
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can u have ur contact number ?
9445786275 - chennai.
and thanks for information
Thanks for information .
Myself Sumit Barthwal post-graduated (chemistry) from Kanpur university, India. Presently I am working in DST Unit of Nanosciences Center at Indian Institute of Technology (IIT) Kanpur (India). I am working here from past 5 years and have experience of handling and operating different materials characterization tools (like AFM/STM, XRD, SAXs, maskless lithography and SEM) and interpretating data from them. I am also involved in different projects going on here. Now I want to pursue the Doctorate program that will widen my horizons and help me acquire the versatility required to achieve my full potential. Kindly help me ........
We have SEM Facility in our group in IIT Kanpur, just visit IIT Kanpur website , there in center and facility u will find nanoscience link there u will find details regarding SEM booking . And in MME department they have TEM facility also
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