Thursday, February 24, 2011: 16.00 GMT
08.00 PT / 11.00 ET / 16.00 United Kingdom / 17.00 Central Europe

This webinar will introduce the operational principles of Raman imaging as a tool for analyzing the chemical characteristics of a sample three dimensionally including the distribution of the chemical compounds, crystallinity and material stress fields.

Topographic Raman imaging is a new imaging mode which allows confocal Raman imaging guided by the surface topography obtained by an integrated profilometer. Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data. This allows for the first time confocal Raman imaging along heavily inclined or very rough samples with the true surface held in constant focus while maintaining the highest confocality. With this new imaging mode, samples that had previously required extensive preparation in order to obtain a certain surface flatness can now be effortlessly and automatically characterized as they are.

The True Surface Imaging mode is also an ideal supplement to atomic force microscopy (AFM), which provides topographic information on small sample areas with ultra-high precision.