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Atomic Force Microscopy Webinar Series
Advances in AFM Nanomechanics
Webinar Date & Time
» Wednesday, February 20, 2013 8:00 AM PST*
Dr. Bede Pittenger, Senior Applications Scientist, Bruker Nano Surfaces
Correlated PeakForce QNM and PeakForce KPFM images of the same graphene flake, prepared on silicon dioxide (Dimension Icon AFM, 15um scan). The topographic and electrical maps both show the expected layered structure. The top left topographic image reveals the expected 300pm graphene step between successive layers. The images to show detailed mechanical property measurements of a defect rich area to reveal fine structures with greater compliance (darker areas on the modulus map image) and reduced adhesion compared to the undisturbed portion of the layer.
Atomic force microscopes (AFM) can measure and map mechanical properties of materials with very high resolution. Recently, real-time control of the peak force of the tip-sample interaction has led to a fundamental change in AFM imaging, providing quantitative mapping of mechanical properties at unprecedented resolution. During material property mapping, the time scale of tip-sample interaction now spans from microseconds to seconds, tip sample forces can be controlled from piconewtons to micronewtons, and spatial resolution can reach sub-nanometer. AFM has become a unique mechanical measurement tool having large dynamic range (1kPa to 100GPa in modulus) with the flexibility to integrate with other physical property characterization techniques.
In this webinar we will describe the high resolution mechanical property mapping capabilities of PeakForce QNM and Force Volume as well as demonstrating the ability to examine the details of the tip-sample interaction in individual curves. Additionally, we will discuss the benefits of doing co-located measurements with other techniques such as Kelvin Probe Force Microscopy (KPFM) and Raman for research into samples as diverse as bacteria and graphene.
The live broadcast will include a fully-interactive Q&A session to answer all of your applications questions. Register today to reserve your seat.
January 23, 2013, 8:00 AM PST*
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