Application deadline: May 05, 2014

CRS4 is looking for a senior analytical microscopist (REF A) with expertise in diagnostic test and failure analysis of microelectronic device and for a junior analytical microscopist (REF B) with expertise in microscopy applied to Materials and Life Sciences.
Applicants must hold a phD degree in Informatics, Engineering, Mathematics, Pyhsics or or Natural Sciences.

Must-have requirements are expertise in Scanning Electron Microscopy (SEM) and Energy-Dispersive x-ray Spectroscopy (EDS), knowledge of protocols for Focused Ion Beam (FIB), experience in dealing with industry-related problems in microscopy, teamwork ability. In addition for REF A is compulsory the expertise in diagnostic test and failure analysis of microelectronic device while for REF B is the expertise in microscopy applied to Materials and Life Sciences.
Nice-to-Have requirement is a previous experience with Fei Tecnai Transmission Electron Microscope (TEM) and with microscopy-oriented data system managements systems (DBMS) such as Omero.

Job descriptions:

REF A: The candidate will manage the microscopy laboratory, deal with customers, prepare samples for SEM/FIB/TEM, study new lab protocols in microscopy customized to fit the client needs, analyze samples, write reports and help in the achievement of cloud-based access/interaction to the microscopes.
REF B: The candidate will help in the day-to-day activities of the microscopy laboratory, deal with customers, prepare samples for SEM/FIB,TEM, study new lab protocols in microscopy customized to fit the client needs, analyze samples, write reports and help in the achievement of cloud-based access/interaction to the microscopes.

pdf

Contact:

Giovanni Delussu
Email: surfer@crs4.it

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