Seeking a research associate to perform collaborative research at the National Institute of Standards and technology (Gaithersburg, MD, USA) on developing high precision, atomic-scale structural measurement techniques for the characterization of complex structures in a transmission electron microscope. Experience with electron microscopy and knowledge of the FEI TIA and Gatan Digital Micrograph scripting interfaces is required, as well as some experience with customization of electron-beam equipment. Some experience with computational image processing through Python, Matlab, C, etc. would also be of benefit.

pdf

Further information:

Igor Levin
Phone: 301-975-6142
Email: igor.levin@nist.gov

Votes: 0
E-mail me when people leave their comments –

You need to be a member of The International NanoScience Community - Nanopaprika.eu to add comments!

Join The International NanoScience Community - Nanopaprika.eu