We are looking for an experimental electron microscopist to come and join a small team working on the in-situ operation of semiconductor specimens. The project is focused on technique development.
Different semiconductors such as memories, transistors and PV devices will be switched using electrical biasing in the TEM and the structure, composition and internal fields will be measured as a function of the device state.
We are looking for someone who has skills in some or all of the following areas to add strength to a growing in-situ TEM activity at Minatec in Grenoble.
- High-resolution aberration corrected (S)TEM / electron holography.
- Specimen preparation by focused ion beam / Ar milling.
- In situ TEM.
- Electrical test / contacting of semiconductor devices (2D and/or 3D).
In situ TEM is challenging and we are looking for a dynamic, self-starter who is prepared to engage and solve the problems that will be encountered.
At the Minatec characterization centre, facilities, such as a monochromated FEI Titan Ultimate TEM, with image and probe correctors, Lorentz lens, Gatan energy filter and an electron biprism are available. Additional TEMs available include a probe corrected FEI Themis with ChemiTEM equipped for electron holography, a FEI Osiris with ChemiSTEM and a FEI Tecnai. We also have three different dual beam focused ion beam (FIB) systems, a Xe ion Plasma FIB as well as tools such as Atom Probe, SIMS, Scanning probe, XPS and a range of analytical SEMs.
Contact:
David Cooper
Tel.: +(33)438781927
Email: david.cooper@cea.fr
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