Progress in micro and nanotechnology strongly relies on the development of sophisticated structural and analytical tools. The Nano-Characterization Platform of CEA-LETI comprises several state-of-the-art transmission electron microscopes (TEM) dedicated to sub-atomic imaging and spectral analysis. This thesis aims at the development of analytical electron tomography, which is the 3D extension of analytical electron microscopy. The first task will be to automate the tilting of the stage and the acquisition of spectrum images. The candidate will then explore various tomographic reconstruction algorithms, in collaboration with the department of Applied Mathematics and Theoretical Physics, University of Cambridge, UK. Finally, different experimental conditions and tools for absorption correction will be tested with the aim to achieve fully quantitative chemical analysis. The implementation of these techniques will be validated on samples with known structure and composition, and applied to nanotechnology devices provided by industrial partners of CEA-LETI.
LOCATION
Département Technologies Silicium (LETI) Service Caractérisation des Matériaux et Composants Autre laboratoire Centre : Grenoble Date souhaitée pour le début de la thèse : 01-09-2016
CONTACT PERSON
Zineb SAGHI CEA DRT/DTSI/SCMC/Autre Commissariat à l’énergie atomique et aux énergies alternatives MINATEC Campus | 17 rue des martyrs | F-38054 Grenoble Cedex Téléphone : 0438784870 Email : zineb.saghi@cea.fr
UNIVERSITY / GRADUATE SCHOOL
INSA Lyon Ecole Doctorale Matériaux de Lyon
THESIS SUPERVISOR
Thierry EPICIER MATEIS Bâtiment Blaise Pascal - 7, avenue Jean Capelle 69621 Villeurbanne
SL-DRT-16-0110
RESEARCH FIELD
Instrumentation
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