Experimental Officer of EM User Facility

The position will be filled as soon as an appropriate candidate has been identified

The group operates three FEI transmission electron microscopes (TEM), among these a recently installed double-corrected monochromated Titan3 Themis 60-300, and a fully equipped laboratory for TEM sample preparation with a new focused ion beam instrument (FEI Helios Nanolab 660). Our research focuses on the development and application of advanced TEM and FIB-SEM techniques for quantitative analysis of materials with the goal to contribute to an understanding of structure-property relationships and the role of defects at the microscopic scale. Within the Center for Nanoanalysis and Electron Microscopy (CENEM) we run an EM user facility which aims at making our electron microscopy expertise and instrumentation available to researchers at the University and beyond.

As an experimental officer of the EM user facility your responsibilities include

  • organization of the user facility (booking system, user fees,…)
  • training of users at the microscopes
  • high-quality TEM investigations in research collaborations and for industrial partners
  • interaction with FEI concerning service contracts
  • organization of Erlangen TEM schools
  • participation in research projects of the electron microscopy group

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PhD/PostDoc Positions in the fields of advanced analytical TEM / electron tomography (ET) / in situ TEM

The position will be filled as soon as an appropriate candidate has been identified

The research of the electron microscopy group focuses on the development and application of advanced TEM and FIB-SEM techniques for quantitative analysis of materials with the goal to contribute to an understanding of structure-property relationships and the role of defects at the microscopic scale. Within various projects funded by the German Science Foundation (DFG) we address a broad range of materials, including individual nanoparticles and nanoparticulate systems (EXC315, GRK1161), porous materials (SPP1570), carbon allotropes (SFB953), high-temperature materials (GRK1229, SFB-TR103), glass materials (SPP1594) as well as thin films and coatings. Our recently established research training group GRK 1896 “In situ microscopy with electrons, X-rays and scanning probes” is devoted to the complementary use of different in situ techniques for studying the formation and functional/mechanical properties of nanostructures and their interfaces (http://www.grk1896.uni-erlangen.de).

Our electron microscopy group is rapidly expanding and is currently being transformed into a full chair / institute of the materials science department. Moreover, the Center for Nanoanalysis and Electron Microscopy (CENEM) has been established as a core facility (with funding from DFG within the core facility inititative) and will further extend its activities as a user facility to support nanostructure research at the University of Erlangen-Nürnberg and beyond. We are therefore looking for highly qualified PhD/PostDoc researchers with experience in one or more of the above mentioned TEM techniques to strengthen our team in the various research areas and to support our activities in the CENEM.

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Research Engineer in Electron Microscopy and FIB Sample Preparation

We will start reviewing applications after October 1st, 2014, and the search will continue until the position is filled

The group operates three FEI transmission electron microscopes (TEM), among these a recently installed double-corrected monochromated Titan3 Themis 60-300, and a fully equipped laboratory for TEM sample preparation with a new focused ion beam instrument (FEI Helios Nanolab 660). Our research focuses on the development and application of advanced TEM and FIB-SEM techniques for quantitative analysis of materials with the goal to contribute to an understanding of structure-property relationships and the role of defects at the microscopic scale. Within the Center for Nanoanalysis and Electron Microscopy (CENEM) we run an EM user facility which aims at making our electron microscopy expertise and instrumentation available to researchers at the University and beyond.

As research engineer your responsibilities include

  • daily maintenance of FIB-SEM and other equipment for TEM sample preparation; interaction with the manufacturers
  • training of users at the FIB-SEM
  • calibration and basic alignment of FIB-SEM and TEMs
  • conventional TEM sample preparation
  • TEM sample preparation by FIB and basic SEM and TEM investigations in projects of the electron microscopy group, research collaborations and for industrial partners

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Contact:

Prof. E. Spiecker
Email: Erdmann.Spiecker@ww.uni-erlangen.de

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